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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F09%3APU81550%21RIV10-MSM-26220___
rdf:type
skos:Concept n22:Vysledek
dcterms:description
The electro-ultrasonic spectroscopy is non-destructive testing method for cermet resistors. This method can be used as a diagnostic tool for the quality and reliability assessment. AC current varying with frequency fE and the ultrasonic signal varying with frequency fU are applied on the conducting sample and a new intermodulation signal on the frequency fm given by the superposition or subtraction of exciting frequencies is measured on the sample. The sample resistance is influenced by the ultrasonic signal. The ultrasonic signal changes the contact area between the conducting grains in the sample structure and then resistance is modulated by the frequency of ultrasonic excitation. The electrical charge and also the electrical current flowing through the sample structure are conserved. In case the contact area between the conducting grains is changing then the current density is changed. This leads to the resistivity change of measured structure. We suppose that for the sample with more defects in th The electro-ultrasonic spectroscopy is non-destructive testing method for cermet resistors. This method can be used as a diagnostic tool for the quality and reliability assessment. AC current varying with frequency fE and the ultrasonic signal varying with frequency fU are applied on the conducting sample and a new intermodulation signal on the frequency fm given by the superposition or subtraction of exciting frequencies is measured on the sample. The sample resistance is influenced by the ultrasonic signal. The ultrasonic signal changes the contact area between the conducting grains in the sample structure and then resistance is modulated by the frequency of ultrasonic excitation. The electrical charge and also the electrical current flowing through the sample structure are conserved. In case the contact area between the conducting grains is changing then the current density is changed. This leads to the resistivity change of measured structure. We suppose that for the sample with more defects in th
dcterms:title
Electro Ultrasonic Spectroscopy of Cermet Thick Films Electro Ultrasonic Spectroscopy of Cermet Thick Films
skos:prefLabel
Electro Ultrasonic Spectroscopy of Cermet Thick Films Electro Ultrasonic Spectroscopy of Cermet Thick Films
skos:notation
RIV/00216305:26220/09:PU81550!RIV10-MSM-26220___
n3:aktivita
n12:Z n12:P
n3:aktivity
P(GA106/07/1393), P(GD102/09/H074), Z(MSM0021630503)
n3:dodaniDat
n20:2010
n3:domaciTvurceVysledku
n8:6541763 n8:6209947 n8:5802407 n8:9770690
n3:druhVysledku
n19:D
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n21:predkladatel
n3:idSjednocenehoVysledku
312791
n3:idVysledku
RIV/00216305:26220/09:PU81550
n3:jazykVysledku
n16:eng
n3:klicovaSlova
Cermet resistor, electro-ultrasonic spectroscopy, resistivity change
n3:klicoveSlovo
n10:Cermet%20resistor n10:resistivity%20change n10:electro-ultrasonic%20spectroscopy
n3:kontrolniKodProRIV
[9BBA81A2B108]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Brno
n3:nazevZdroje
32nd International Spring Seminar on Electronics Technology
n3:obor
n5:BE
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
4
n3:projekt
n7:GD102%2F09%2FH074 n7:GA106%2F07%2F1393
n3:rokUplatneniVysledku
n20:2009
n3:tvurceVysledku
Chvátal, Miloš Tofel, Pavel Šikula, Josef Sedláková, Vlasta
n3:typAkce
n13:EUR
n3:zahajeniAkce
2009-05-13+02:00
n3:zamer
n15:MSM0021630503
s:numberOfPages
2
n11:hasPublisher
Neuveden
n18:isbn
978-1-4244-4260-7
n4:organizacniJednotka
26220