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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F08%3APU76446%21RIV10-MSM-26220___
rdf:type
n14:Vysledek skos:Concept
dcterms:description
The contribution is focused on determination of a temperature inside PN junction defect regions. These defect regions are called microplasmas. The microplasma is specified like region with a lower strong-field avalanche ionization breakdown voltage than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occurring in reverse-biased PN junction at certain voltage. These local avalanche breakdowns may exhibit like a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and random pulse origin time points. During the measurement of the microplasma noise was observed a relation between two-states current impulse noise and a temperature of a PN junction defect region. The main goal of this article is a determination of temperature behavior inside the microplasma region depends on a current impulse noise time behavior. The contribution is focused on determination of a temperature inside PN junction defect regions. These defect regions are called microplasmas. The microplasma is specified like region with a lower strong-field avalanche ionization breakdown voltage than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occurring in reverse-biased PN junction at certain voltage. These local avalanche breakdowns may exhibit like a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and random pulse origin time points. During the measurement of the microplasma noise was observed a relation between two-states current impulse noise and a temperature of a PN junction defect region. The main goal of this article is a determination of temperature behavior inside the microplasma region depends on a current impulse noise time behavior.
dcterms:title
Behavior of Temperature Inside PN Junction During Microplasma Switching Behavior of Temperature Inside PN Junction During Microplasma Switching
skos:prefLabel
Behavior of Temperature Inside PN Junction During Microplasma Switching Behavior of Temperature Inside PN Junction During Microplasma Switching
skos:notation
RIV/00216305:26220/08:PU76446!RIV10-MSM-26220___
n4:aktivita
n13:Z n13:P
n4:aktivity
P(GA102/06/1551), Z(MSM0021630503)
n4:dodaniDat
n8:2010
n4:domaciTvurceVysledku
n16:6039618 n16:6995586 n16:3502465 Andreev, Alexey
n4:druhVysledku
n20:D
n4:duvernostUdaju
n6:S
n4:entitaPredkladatele
n11:predkladatel
n4:idSjednocenehoVysledku
357737
n4:idVysledku
RIV/00216305:26220/08:PU76446
n4:jazykVysledku
n18:eng
n4:klicovaSlova
microplasma noise, PN junction, defect, diode, avalanche breakdown
n4:klicoveSlovo
n5:defect n5:avalanche%20breakdown n5:PN%20junction n5:microplasma%20noise n5:diode
n4:kontrolniKodProRIV
[34EE6485F7D5]
n4:mistoKonaniAkce
Budapest
n4:mistoVydani
Budapest, Hungary
n4:nazevZdroje
Reliability and Life-time Prediction
n4:obor
n17:JA
n4:pocetDomacichTvurcuVysledku
4
n4:pocetTvurcuVysledku
4
n4:projekt
n9:GA102%2F06%2F1551
n4:rokUplatneniVysledku
n8:2008
n4:tvurceVysledku
Koktavý, Pavel Andreev, Alexey Holcman, Vladimír Raška, Michal
n4:typAkce
n19:WRD
n4:zahajeniAkce
2008-05-07+02:00
n4:zamer
n7:MSM0021630503
s:numberOfPages
4
n21:hasPublisher
Zsolt Illyefalvi-Vitez
n15:isbn
978-963-06-4915-5
n12:organizacniJednotka
26220