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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F08%3APU76390%21RIV10-MSM-26220___
rdf:type
n12:Vysledek skos:Concept
dcterms:description
This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison. This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison.
dcterms:title
DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL
skos:prefLabel
DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL
skos:notation
RIV/00216305:26220/08:PU76390!RIV10-MSM-26220___
n3:aktivita
n13:Z
n3:aktivity
Z(MSM0021630516)
n3:dodaniDat
n11:2010
n3:domaciTvurceVysledku
n4:3488845 n4:3490971 n4:8976961
n3:druhVysledku
n19:D
n3:duvernostUdaju
n10:S
n3:entitaPredkladatele
n6:predkladatel
n3:idSjednocenehoVysledku
362309
n3:idVysledku
RIV/00216305:26220/08:PU76390
n3:jazykVysledku
n16:eng
n3:klicovaSlova
electroluminescence, photoluminescence, solar cell, crystalline silicon, CCD camera, defect analysis, LBIC method
n3:klicoveSlovo
n5:defect%20analysis n5:solar%20cell n5:electroluminescence n5:CCD%20camera n5:LBIC%20method n5:crystalline%20silicon n5:photoluminescence
n3:kontrolniKodProRIV
[F446CD249550]
n3:mistoKonaniAkce
Valencie
n3:mistoVydani
Neuveden
n3:nazevZdroje
23rd European Photovoltaic Solar Energy Conference, 1-5 September 2008, Valencia, Spain
n3:obor
n15:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:rokUplatneniVysledku
n11:2008
n3:tvurceVysledku
Vaněk, Jiří Bařinka, Radim Jandová, Kristýna
n3:typAkce
n18:EUR
n3:zahajeniAkce
2008-09-01+02:00
n3:zamer
n20:MSM0021630516
s:numberOfPages
3
n17:hasPublisher
Neuveden
n14:isbn
3-936338-24-8
n21:organizacniJednotka
26220