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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F08%3APU75406%21RIV10-MSM-26220___
rdf:type
n8:Vysledek skos:Concept
dcterms:description
This paper deals with issues of technological process characterization and optimization by application of empirical models. The general aim is to create methodology for technological process optimization. The methodology consist of appropriate experimental plan that yields the most information from predetermined model with the last number of experiments runs. This statistical approach determines cause and effect relationships between technological variables and responses with respect to the quality and reliability. This paper deals with issues of technological process characterization and optimization by application of empirical models. The general aim is to create methodology for technological process optimization. The methodology consist of appropriate experimental plan that yields the most information from predetermined model with the last number of experiments runs. This statistical approach determines cause and effect relationships between technological variables and responses with respect to the quality and reliability.
dcterms:title
Dynamic light beam induced voltage testing method of solar cell Dynamic light beam induced voltage testing method of solar cell
skos:prefLabel
Dynamic light beam induced voltage testing method of solar cell Dynamic light beam induced voltage testing method of solar cell
skos:notation
RIV/00216305:26220/08:PU75406!RIV10-MSM-26220___
n4:aktivita
n14:Z
n4:aktivity
Z(MSM0021630516)
n4:dodaniDat
n11:2010
n4:domaciTvurceVysledku
n13:3488845 n13:8936358 n13:6286216 n13:8976961
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n7:D
n4:duvernostUdaju
n17:S
n4:entitaPredkladatele
n16:predkladatel
n4:idSjednocenehoVysledku
364615
n4:idVysledku
RIV/00216305:26220/08:PU75406
n4:jazykVysledku
n5:eng
n4:klicovaSlova
LBIV, solar cell, laser beam, defects
n4:klicoveSlovo
n10:solar%20cell n10:LBIV n10:defects n10:laser%20beam
n4:kontrolniKodProRIV
[D39242E989E6]
n4:mistoKonaniAkce
Brno
n4:mistoVydani
Brno
n4:nazevZdroje
EDS ´08 IMAPS CS INTERNATIONAL CONFERENCE PROCEEDINGS
n4:obor
n18:JA
n4:pocetDomacichTvurcuVysledku
4
n4:pocetTvurcuVysledku
4
n4:rokUplatneniVysledku
n11:2008
n4:tvurceVysledku
Vaněk, Jiří Dolenský, Jan Kazelle, Jiří Jandová, Kristýna
n4:typAkce
n6:WRD
n4:zahajeniAkce
2008-09-10+02:00
n4:zamer
n19:MSM0021630516
s:numberOfPages
4
n15:hasPublisher
Vysoké učení technické v Brně
n21:isbn
978-80-214-3717-3
n20:organizacniJednotka
26220