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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F08%3APU74267%21RIV10-MSM-26220___
rdf:type
n8:Vysledek skos:Concept
dcterms:description
This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells. This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells.
dcterms:title
Study of solar cells defects via noise measurement Study of solar cells defects via noise measurement
skos:prefLabel
Study of solar cells defects via noise measurement Study of solar cells defects via noise measurement
skos:notation
RIV/00216305:26220/08:PU74267!RIV10-MSM-26220___
n4:aktivita
n6:Z n6:P
n4:aktivity
P(GA102/06/1551), Z(MSM0021630503)
n4:dodaniDat
n10:2010
n4:domaciTvurceVysledku
n16:3502465 n16:3673332
n4:druhVysledku
n21:D
n4:duvernostUdaju
n7:S
n4:entitaPredkladatele
n12:predkladatel
n4:idSjednocenehoVysledku
398167
n4:idVysledku
RIV/00216305:26220/08:PU74267
n4:jazykVysledku
n18:eng
n4:klicovaSlova
Microplasma noise, A-type noise, Impulse duration, Impulse separation, PN junction, Solar cell
n4:klicoveSlovo
n5:PN%20junction n5:Impulse%20duration n5:Impulse%20separation n5:A-type%20noise n5:Microplasma%20noise n5:Solar%20cell
n4:kontrolniKodProRIV
[204C39F831E9]
n4:mistoKonaniAkce
Budapest
n4:mistoVydani
Hungary, Budapest
n4:nazevZdroje
Reliability and Life-time Prediction Conference Proceedings
n4:obor
n19:BM
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
2
n4:projekt
n15:GA102%2F06%2F1551
n4:rokUplatneniVysledku
n10:2008
n4:tvurceVysledku
Koktavý, Pavel Macků, Robert
n4:typAkce
n11:WRD
n4:wos
000272337900021
n4:zahajeniAkce
2008-05-07+02:00
n4:zamer
n14:MSM0021630503
s:numberOfPages
5
n17:hasPublisher
Mesterprint Printinghouse Ltd.
n13:isbn
978-963-06-4915-5
n20:organizacniJednotka
26220