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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F07%3APU68758%21RIV08-MSM-26220___
rdf:type
skos:Concept n17:Vysledek
dcterms:description
This paper shows an application of the Ito stochastic calculus to the problem of modelling inductor-resistor electrical circuits. The deterministic model of the circuit is replaced by a stochastic model by adding a noise term in the source. The analytic solution of the resulting stochastic differential equation is obtained using the Ito formula. Statistical estimates of the stochastic solutions are examined and confidence intervals are found for the trajectories of the solution. The programming language C#, a part of the new MS .NET platform, is used for numerical simulations. The results were verified in an experiment by measurements on inductor-resistor electrical circuits. This paper shows an application of the Ito stochastic calculus to the problem of modelling inductor-resistor electrical circuits. The deterministic model of the circuit is replaced by a stochastic model by adding a noise term in the source. The analytic solution of the resulting stochastic differential equation is obtained using the Ito formula. Statistical estimates of the stochastic solutions are examined and confidence intervals are found for the trajectories of the solution. The programming language C#, a part of the new MS .NET platform, is used for numerical simulations. The results were verified in an experiment by measurements on inductor-resistor electrical circuits. This paper shows an application of the Ito stochastic calculus to the problem of modelling inductor-resistor electrical circuits. The deterministic model of the circuit is replaced by a stochastic model by adding a noise term in the source. The analytic solution of the resulting stochastic differential equation is obtained using the Ito formula. Statistical estimates of the stochastic solutions are examined and confidence intervals are found for the trajectories of the solution. The programming language C#, a part of the new MS .NET platform, is used for numerical simulations. The results were verified in an experiment by measurements on inductor-resistor electrical circuits.
dcterms:title
STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS
skos:prefLabel
STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS STOCHASTIC MODELS OF RL CIRCUITS IN EXPERIMENTS
skos:notation
RIV/00216305:26220/07:PU68758!RIV08-MSM-26220___
n5:strany
1-3
n5:aktivita
n14:Z
n5:aktivity
Z(MSM0021630513), Z(MSM0021630516)
n5:dodaniDat
n15:2008
n5:domaciTvurceVysledku
n13:6157165 Kolářová, Edita
n5:druhVysledku
n8:D
n5:duvernostUdaju
n20:S
n5:entitaPredkladatele
n21:predkladatel
n5:idSjednocenehoVysledku
452556
n5:idVysledku
RIV/00216305:26220/07:PU68758
n5:jazykVysledku
n9:eng
n5:klicovaSlova
stochastic models, RL circuits in experiments, modelling inductor-resistor electrical circuits
n5:klicoveSlovo
n11:RL%20circuits%20in%20experiments n11:stochastic%20models n11:modelling%20inductor-resistor%20electrical%20circuits
n5:kontrolniKodProRIV
[ADF4A742AA14]
n5:mistoKonaniAkce
Paris
n5:mistoVydani
Paris
n5:nazevZdroje
TIEF 2007
n5:obor
n10:JA
n5:pocetDomacichTvurcuVysledku
2
n5:pocetTvurcuVysledku
2
n5:rokUplatneniVysledku
n15:2007
n5:tvurceVysledku
Kubásek, Radek Kolářová, Edita
n5:typAkce
n6:EUR
n5:zahajeniAkce
2007-07-01+02:00
n5:zamer
n16:MSM0021630513 n16:MSM0021630516
s:numberOfPages
3
n19:hasPublisher
UTEE, FEKT VUT v Brně
n12:isbn
978-80-214-3476-9
n18:organizacniJednotka
26220