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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F04%3APU52177%21RIV06-MSM-26220___
rdf:type
skos:Concept n7:Vysledek
dcterms:description
Teplotní závislost Hoogeova parametru alfaH p- a n-InGaAs/InAlAs heterostruktur byla změřena v rozmezí 15K až 300K. Hodnota alfaH~1 pro p typ nezávisí na teplotě, pro n-typ je alfaH~2x10-3 konstantní až do 150K a pro nižší teploty roste přibližně o jedenřád, nejspíše vlivem pastí. The temperature dependence of Hooge parameter alfaH of the p- and n-InGaAs/InAlAs heterostructures was measured in 15K to 300K range. The p-type alfaH ~ 1 doesn't change with temperature, the n-type alfaH ~ 2x10-3 is constant down to 150K and then increases about one order, probably due to the influence of traps. The temperature dependence of Hooge parameter alfaH of the p- and n-InGaAs/InAlAs heterostructures was measured in 15K to 300K range. The p-type alfaH ~ 1 doesn't change with temperature, the n-type alfaH ~ 2x10-3 is constant down to 150K and then increases about one order, probably due to the influence of traps.
dcterms:title
Teplotní závislost 1/f šumu v p- a n-InGaAs/InAlAs heterostrukturách Temperature dependence of 1/f noise in p- and n-InGaAs/InAlAs heterostructures Temperature dependence of 1/f noise in p- and n-InGaAs/InAlAs heterostructures
skos:prefLabel
Teplotní závislost 1/f šumu v p- a n-InGaAs/InAlAs heterostrukturách Temperature dependence of 1/f noise in p- and n-InGaAs/InAlAs heterostructures Temperature dependence of 1/f noise in p- and n-InGaAs/InAlAs heterostructures
skos:notation
RIV/00216305:26220/04:PU52177!RIV06-MSM-26220___
n5:strany
87-93
n5:aktivita
n8:P n8:Z
n5:aktivity
P(ME 285), Z(MSM 262200022)
n5:cisloPeriodika
1
n5:dodaniDat
n12:2006
n5:domaciTvurceVysledku
n9:7526938 n9:9770690
n5:druhVysledku
n6:J
n5:duvernostUdaju
n18:S
n5:entitaPredkladatele
n17:predkladatel
n5:idSjednocenehoVysledku
589803
n5:idVysledku
RIV/00216305:26220/04:PU52177
n5:jazykVysledku
n13:eng
n5:klicovaSlova
InGaAs HEMT, 1/f noise
n5:klicoveSlovo
n14:1%2Ff%20noise n14:InGaAs%20HEMT
n5:kodStatuVydavatele
JP - Japonsko
n5:kontrolniKodProRIV
[C4A0339CE1ED]
n5:nazevZdroje
Research Bulletin of Meisei University - Physical Sciences and Engineering
n5:obor
n19:JA
n5:pocetDomacichTvurcuVysledku
2
n5:pocetTvurcuVysledku
5
n5:projekt
n15:ME%20285
n5:rokUplatneniVysledku
n12:2004
n5:svazekPeriodika
40
n5:tvurceVysledku
Šikula, Josef Musha, Toshimitsu Tanuma, Nobuhisa Pavelka, Jan Tacano, Munecazu
n5:zamer
n11:MSM%20262200022
s:issn
1346-7239
s:numberOfPages
7
n16:organizacniJednotka
26220