This HTML5 document contains 50 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n22http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n19http://localhost/temp/predkladatel/
n9http://purl.org/net/nknouf/ns/bibtex#
n12http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n6http://linked.opendata.cz/resource/domain/vavai/projekt/
n16http://linked.opendata.cz/ontology/domain/vavai/
n17http://linked.opendata.cz/resource/domain/vavai/zamer/
n7https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n13http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216305%3A26220%2F04%3APU43648%21RIV%2F2005%2FMSM%2F262205%2FN/
n5http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n11http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n20http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n14http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n21http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n10http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F04%3APU43648%21RIV%2F2005%2FMSM%2F262205%2FN
rdf:type
skos:Concept n16:Vysledek
dcterms:description
Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of per Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of per Rastrovací optická mikroskopie v blízkém poli(SNOM) je možné použít k měření vnitřního rozložení vidů a lokálních vlastností vlnovodu. Malé fluktuace charakteristik materiálu mohou ovlivnit vlastní měření. Lokální sondové měření umožní vyhnout se tomutoproblému a experimentálně ověřit perturbace zavedené při měření pomocí sondy SNOM.
dcterms:title
Local characterization of optical waveguide structure using Scanning near-field optical microscopy Lokální charakterizace struktur optických vlnovodů pomocí rastrovací optické mikroskopie v blízkém poli Local characterization of optical waveguide structure using Scanning near-field optical microscopy
skos:prefLabel
Lokální charakterizace struktur optických vlnovodů pomocí rastrovací optické mikroskopie v blízkém poli Local characterization of optical waveguide structure using Scanning near-field optical microscopy Local characterization of optical waveguide structure using Scanning near-field optical microscopy
skos:notation
RIV/00216305:26220/04:PU43648!RIV/2005/MSM/262205/N
n3:strany
183-186
n3:aktivita
n14:Z n14:P
n3:aktivity
P(ME 544), P(OC 523.40), Z(MSM 262200022)
n3:dodaniDat
n10:2005
n3:domaciTvurceVysledku
n12:2108585 n12:6998801 n12:6493645
n3:druhVysledku
n21:D
n3:duvernostUdaju
n11:S
n3:entitaPredkladatele
n13:predkladatel
n3:idSjednocenehoVysledku
571689
n3:idVysledku
RIV/00216305:26220/04:PU43648
n3:jazykVysledku
n20:eng
n3:klicovaSlova
waveguide, optical properties, local probe measurement
n3:klicoveSlovo
n5:optical%20properties n5:local%20probe%20measurement n5:waveguide
n3:kontrolniKodProRIV
[233D97976F20]
n3:mistoKonaniAkce
Častá-Píla
n3:mistoVydani
Bratislava
n3:nazevZdroje
Applied physics on condensed matter APCOM – 2004
n3:obor
n18:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n6:ME%20544 n6:OC%20523.40
n3:rokUplatneniVysledku
n10:2004
n3:tvurceVysledku
Tománek, Pavel Grmela, Lubomír Otevřelová, Dana
n3:typAkce
n22:EUR
n3:zahajeniAkce
2004-06-16+02:00
n3:zamer
n17:MSM%20262200022
s:numberOfPages
4
n9:hasPublisher
Slovenská technická univerzita v Bratislave
n7:isbn
80-227-2073-9
n19:organizacniJednotka
26220