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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F04%3APU41919%21RIV11-MSM-26220___
rdf:type
n9:Vysledek skos:Concept
dcterms:description
The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the AFM control. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF. The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the AFM control. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF.
dcterms:title
Applying Feedback Control in Atomic Force Microscopy. Applying Feedback Control in Atomic Force Microscopy.
skos:prefLabel
Applying Feedback Control in Atomic Force Microscopy. Applying Feedback Control in Atomic Force Microscopy.
skos:notation
RIV/00216305:26220/04:PU41919!RIV11-MSM-26220___
n3:aktivita
n13:V n13:Z
n3:aktivity
V, Z(MSM 260000013)
n3:dodaniDat
n4:2011
n3:domaciTvurceVysledku
n6:4603575
n3:druhVysledku
n17:D
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n14:predkladatel
n3:idSjednocenehoVysledku
555251
n3:idVysledku
RIV/00216305:26220/04:PU41919
n3:jazykVysledku
n5:eng
n3:klicovaSlova
Feedback Control, Atomic Force Microscopy
n3:klicoveSlovo
n10:Atomic%20Force%20Microscopy n10:Feedback%20Control
n3:kontrolniKodProRIV
[3AF65FCE38ED]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Brno
n3:nazevZdroje
Sborník pracíkonference a souteze Student EEICT 2004
n3:obor
n7:BC
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:rokUplatneniVysledku
n4:2004
n3:tvurceVysledku
Hrouzek, Michal
n3:typAkce
n15:CST
n3:zahajeniAkce
2004-06-29+02:00
n3:zamer
n20:MSM%20260000013
s:numberOfPages
5
n16:hasPublisher
Vysoké učení technické v Brně
n19:organizacniJednotka
26220