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Namespace Prefixes

PrefixIRI
n8http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n20http://localhost/temp/predkladatel/
n19http://purl.org/net/nknouf/ns/bibtex#
n13http://linked.opendata.cz/resource/domain/vavai/projekt/
n12http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n21http://linked.opendata.cz/ontology/domain/vavai/
n6http://linked.opendata.cz/resource/domain/vavai/zamer/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n17http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216305%3A26220%2F03%3APU39624%21RIV11-MSM-26220___/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n4http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n14http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n7http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n9http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n5http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F03%3APU39624%21RIV11-MSM-26220___
rdf:type
n21:Vysledek skos:Concept
dcterms:description
Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and the backscattered electrons are very often used to obtein information about the specimen. In ESEM secondary electrons are mostly detected by a scintillation detector. Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and the backscattered electrons are very often used to obtein information about the specimen. In ESEM secondary electrons are mostly detected by a scintillation detector.
dcterms:title
Detection of Backscattered Electrons in Environmental Scaning Electron Microscope Detection of Backscattered Electrons in Environmental Scaning Electron Microscope
skos:prefLabel
Detection of Backscattered Electrons in Environmental Scaning Electron Microscope Detection of Backscattered Electrons in Environmental Scaning Electron Microscope
skos:notation
RIV/00216305:26220/03:PU39624!RIV11-MSM-26220___
n3:aktivita
n14:P n14:V n14:Z
n3:aktivity
P(GA102/01/1271), V, Z(MSM 262200010)
n3:dodaniDat
n5:2011
n3:domaciTvurceVysledku
n12:7392648 n12:1783017 n12:4511689 n12:8432961
n3:druhVysledku
n9:D
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
603257
n3:idVysledku
RIV/00216305:26220/03:PU39624
n3:jazykVysledku
n7:eng
n3:klicovaSlova
backscattered, electron, environmental, scanning, microscope
n3:klicoveSlovo
n4:microscope n4:environmental n4:electron n4:backscattered n4:scanning
n3:kontrolniKodProRIV
[3F2FA848AC7E]
n3:mistoKonaniAkce
Pula
n3:mistoVydani
Pula, Croatia
n3:nazevZdroje
Proceedings 6th Multinational Congress on Microscopy
n3:obor
n16:JA
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
4
n3:projekt
n13:GA102%2F01%2F1271
n3:rokUplatneniVysledku
n5:2003
n3:tvurceVysledku
Špinka, Jiří Jirák, Josef Wandrol, Petr Autrata, Rudolf
n3:typAkce
n8:WRD
n3:zahajeniAkce
2003-06-01+02:00
n3:zamer
n6:MSM%20262200010
s:numberOfPages
2
n19:hasPublisher
Neuveden
n20:organizacniJednotka
26220