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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F03%3APU39306%21RIV%2F2004%2FMSM%2F262204%2FN
rdf:type
n5:Vysledek skos:Concept
dcterms:description
High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laseer source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer. High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laseer source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer.
dcterms:title
ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER
skos:prefLabel
ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER
skos:notation
RIV/00216305:26220/03:PU39306!RIV/2004/MSM/262204/N
n3:strany
979-979
n3:aktivita
n14:Z
n3:aktivity
Z(MSM 262200022)
n3:dodaniDat
n9:2004
n3:domaciTvurceVysledku
n10:5467853 n10:9923802
n3:druhVysledku
n18:D
n3:duvernostUdaju
n11:S
n3:entitaPredkladatele
n12:predkladatel
n3:idSjednocenehoVysledku
597275
n3:idVysledku
RIV/00216305:26220/03:PU39306
n3:jazykVysledku
n17:eng
n3:klicovaSlova
Laser interferometry, semiconductor laser, temperature stability.
n3:klicoveSlovo
n6:Laser%20interferometry n6:semiconductor%20laser n6:temperature%20stability.
n3:kontrolniKodProRIV
[05A351AEAB9C]
n3:mistoKonaniAkce
Badajoz , Španělsko
n3:mistoVydani
Španělsko
n3:nazevZdroje
1st International Meeting on Applied Physics
n3:obor
n13:JA
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:rokUplatneniVysledku
n9:2003
n3:tvurceVysledku
Číp, Ondřej Mikel, Břetislav
n3:typAkce
n4:WRD
n3:zahajeniAkce
2003-10-13+02:00
n3:zamer
n19:MSM%20262200022
s:numberOfPages
1
n15:hasPublisher
Formatex
n16:organizacniJednotka
26220