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Namespace Prefixes

PrefixIRI
n19http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n18http://purl.org/net/nknouf/ns/bibtex#
n7http://localhost/temp/predkladatel/
n21http://linked.opendata.cz/resource/domain/vavai/projekt/
n12http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n11http://linked.opendata.cz/ontology/domain/vavai/
n14https://schema.org/
shttp://schema.org/
n4http://linked.opendata.cz/ontology/domain/vavai/riv/
skoshttp://www.w3.org/2004/02/skos/core#
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n5http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n17http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n20http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n13http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n15http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216305%3A26220%2F03%3APU39276%21RIV%2F2005%2FMSM%2F262205%2FN/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n10http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n8http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F03%3APU39276%21RIV%2F2005%2FMSM%2F262205%2FN
rdf:type
skos:Concept n11:Vysledek
dcterms:description
Personal-computer-controlled microcomputer units (MCUs) and an AD converter installed in a shield box together with batteries and optical connection from outside make it possible to set automatically the DC power source for low-frequency noise measurements without any line noise. After measuring the device resistance under test automatically at 1 mA, the voltage or the current through MCU and the AD converter in the shield box are automatically switched off in order to minimize the noise induced from thhe electronic circuit. This power source substantially improves the low-frequency noise measurement technology. Personal-computer-controlled microcomputer units (MCUs) and an AD converter installed in a shield box together with batteries and optical connection from outside make it possible to set automatically the DC power source for low-frequency noise measurements without any line noise. After measuring the device resistance under test automatically at 1 mA, the voltage or the current through MCU and the AD converter in the shield box are automatically switched off in order to minimize the noise induced from thhe electronic circuit. This power source substantially improves the low-frequency noise measurement technology. Personal-computer-controlled microcomputer units (MCUs) and an AD converter installed in a shield box together with batteries and optical connection from outside make it possible to set automatically the DC power source for low-frequency noise measurements without any line noise. After measuring the device resistance under test automatically at 1 mA, the voltage or the current through MCU and the AD converter in the shield box are automatically switched off in order to minimize the noise induced from thhe electronic circuit. This power source substantially improves the low-frequency noise measurement technology.
dcterms:title
Fully Computer-controlled Battery Power Source for Low-frequency Noise Measurements Fully Computer-controlled Battery Power Source for Low-frequency Noise Measurements Počítačem plně řízená baterie, jakožto zdroj energie pro nízkofrekvenční měření šumu
skos:prefLabel
Fully Computer-controlled Battery Power Source for Low-frequency Noise Measurements Počítačem plně řízená baterie, jakožto zdroj energie pro nízkofrekvenční měření šumu Fully Computer-controlled Battery Power Source for Low-frequency Noise Measurements
skos:notation
RIV/00216305:26220/03:PU39276!RIV/2005/MSM/262205/N
n4:strany
48-51
n4:aktivita
n20:P
n4:aktivity
P(ME 605)
n4:dodaniDat
n8:2005
n4:domaciTvurceVysledku
n12:9770690
n4:druhVysledku
n10:D
n4:duvernostUdaju
n17:S
n4:entitaPredkladatele
n15:predkladatel
n4:idSjednocenehoVysledku
607790
n4:idVysledku
RIV/00216305:26220/03:PU39276
n4:jazykVysledku
n13:eng
n4:klicovaSlova
noise, battery power source, nondestructive testing
n4:klicoveSlovo
n5:noise n5:nondestructive%20testing n5:battery%20power%20source
n4:kontrolniKodProRIV
[B73DA29F9BD9]
n4:mistoKonaniAkce
Brno
n4:mistoVydani
Brno
n4:nazevZdroje
Noise and Non-linearity Testing of Modern Electronic Components
n4:obor
n16:JA
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
5
n4:projekt
n21:ME%20605
n4:rokUplatneniVysledku
n8:2003
n4:tvurceVysledku
Hashiguchi, Sumihisa Tanuma, Nobuhisa Yokokura, Saburo Šikula, Josef Tacano, Munecazu
n4:typAkce
n19:WRD
n4:zahajeniAkce
2001-08-12+02:00
s:numberOfPages
4
n18:hasPublisher
CNRL
n14:isbn
80-238-9094-8
n7:organizacniJednotka
26220