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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F02%3APU30729%21RIV%2F2003%2FMSM%2F262203%2FN
rdf:type
n17:Vysledek skos:Concept
dcterms:description
We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-siitu analysis of the structures. We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-siitu analysis of the structures.
dcterms:title
Noise and Self-Healing of Tantalum Capacitors Noise and Self-Healing of Tantalum Capacitors
skos:prefLabel
Noise and Self-Healing of Tantalum Capacitors Noise and Self-Healing of Tantalum Capacitors
skos:notation
RIV/00216305:26220/02:PU30729!RIV/2003/MSM/262203/N
n3:strany
181-185
n3:aktivita
n8:P n8:Z
n3:aktivity
P(ME 285), Z(MSM 262200022)
n3:cisloPeriodika
4/2002
n3:dodaniDat
n7:2003
n3:domaciTvurceVysledku
n11:9770690 n11:2108585 n11:7526938
n3:druhVysledku
n4:J
n3:duvernostUdaju
n19:S
n3:entitaPredkladatele
n13:predkladatel
n3:idSjednocenehoVysledku
655718
n3:idVysledku
RIV/00216305:26220/02:PU30729
n3:jazykVysledku
n14:eng
n3:klicovaSlova
self-healing, noise, reliability, tantalum capacitor
n3:klicoveSlovo
n5:noise n5:self-healing n5:reliability n5:tantalum%20capacitor
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[C15A8A5EB15C]
n3:nazevZdroje
Capacitor and Resistor Technology
n3:obor
n16:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
5
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n18:ME%20285
n3:rokUplatneniVysledku
n7:2002
n3:svazekPeriodika
2002
n3:tvurceVysledku
Šikula, Josef Grmela, Lubomír Tacano, Munecazu Pavelka, Jan Hashiguchi, Sumihisa
n3:zamer
n15:MSM%20262200022
s:issn
0887-7491
s:numberOfPages
5
n12:organizacniJednotka
26220