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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F02%3APU30661%21RIV%2F2003%2FMSM%2F262203%2FN
rdf:type
skos:Concept n20:Vysledek
dcterms:description
The paper deals with design of the automatic measurement of noise spectral density. Automatic, fully computer controling apparatus is built-up from suitable sensor, low-noise amplifier with setup gain and frequency band, appropriate analog-digital converter and evaluation software. The philosophy of the apparatus design is based on the fact that the degradation of any device which takes place during its operation is accompanied by irreversible changes in operational, transport and if any, for exampple in LED’s, optical characteristics. All these changes manifest a decreased device reliability. Ageing experiments show that the degradation is manifested through certain parameters, which are relatively easy to measure and proved to be closely correlated with the degradation. Reliability indicators employing operating, transport and stochastic characteristics of LED´s, whose relevance has been verified by our recent analysis, make a basis for the design of a reliability tester. The paper deals with design of the automatic measurement of noise spectral density. Automatic, fully computer controling apparatus is built-up from suitable sensor, low-noise amplifier with setup gain and frequency band, appropriate analog-digital converter and evaluation software. The philosophy of the apparatus design is based on the fact that the degradation of any device which takes place during its operation is accompanied by irreversible changes in operational, transport and if any, for exampple in LED’s, optical characteristics. All these changes manifest a decreased device reliability. Ageing experiments show that the degradation is manifested through certain parameters, which are relatively easy to measure and proved to be closely correlated with the degradation. Reliability indicators employing operating, transport and stochastic characteristics of LED´s, whose relevance has been verified by our recent analysis, make a basis for the design of a reliability tester.
dcterms:title
Noise Tester for Electronic Components Noise Tester for Electronic Components
skos:prefLabel
Noise Tester for Electronic Components Noise Tester for Electronic Components
skos:notation
RIV/00216305:26220/02:PU30661!RIV/2003/MSM/262203/N
n4:strany
59-64
n4:aktivita
n14:Z
n4:aktivity
Z(MSM 262200022)
n4:dodaniDat
n8:2003
n4:domaciTvurceVysledku
n11:6001041 n11:7526938 n11:3502465 n11:2108585
n4:druhVysledku
n21:D
n4:duvernostUdaju
n16:S
n4:entitaPredkladatele
n18:predkladatel
n4:idSjednocenehoVysledku
655729
n4:idVysledku
RIV/00216305:26220/02:PU30661
n4:jazykVysledku
n9:eng
n4:klicovaSlova
spectral density, noise spectroscopy, agening, reliability
n4:klicoveSlovo
n13:agening n13:reliability n13:noise%20spectroscopy n13:spectral%20density
n4:kontrolniKodProRIV
[E3FDB8F7AB83]
n4:mistoKonaniAkce
Brno
n4:mistoVydani
Brno
n4:nazevZdroje
Noise and Non-linearity Testing of Modern Electronic Components - NNT
n4:obor
n17:JA
n4:pocetDomacichTvurcuVysledku
4
n4:pocetTvurcuVysledku
4
n4:pocetUcastnikuAkce
0
n4:pocetZahranicnichUcastnikuAkce
0
n4:rokUplatneniVysledku
n8:2002
n4:tvurceVysledku
Dobis, Pavel Koktavý, Pavel Pavelka, Jan Grmela, Lubomír
n4:typAkce
n5:WRD
n4:zahajeniAkce
2001-09-12+02:00
n4:zamer
n19:MSM%20262200022
s:numberOfPages
6
n6:hasPublisher
Ing. Zdeněk Novotný CSc.
n12:isbn
80-238-9094-8
n15:organizacniJednotka
26220