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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F02%3APU30096%21RIV%2F2003%2FMSM%2F262203%2FN
rdf:type
n14:Vysledek skos:Concept
dcterms:description
A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences. A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences.
dcterms:title
Charge carrier transport and noise of niobium capacitors Charge carrier transport and noise of niobium capacitors
skos:prefLabel
Charge carrier transport and noise of niobium capacitors Charge carrier transport and noise of niobium capacitors
skos:notation
RIV/00216305:26220/02:PU30096!RIV/2003/MSM/262203/N
n4:strany
32-36
n4:aktivita
n19:Z
n4:aktivity
Z(MSM 262200022)
n4:dodaniDat
n9:2003
n4:domaciTvurceVysledku
n13:7526938 n13:9770690 n13:6001041
n4:druhVysledku
n8:D
n4:duvernostUdaju
n18:S
n4:entitaPredkladatele
n5:predkladatel
n4:idSjednocenehoVysledku
640708
n4:idVysledku
RIV/00216305:26220/02:PU30096
n4:jazykVysledku
n10:eng
n4:klicovaSlova
Noise, niobium capacitor, spectral density
n4:klicoveSlovo
n7:Noise n7:niobium%20capacitor n7:spectral%20density
n4:kontrolniKodProRIV
[43122E1BC9A2]
n4:mistoKonaniAkce
Port St. Laurent, Francie
n4:mistoVydani
SWINDON, England
n4:nazevZdroje
Proceeding of CARTS 2002 - 16th European Passive Components Conference
n4:obor
n6:JA
n4:pocetDomacichTvurcuVysledku
3
n4:pocetTvurcuVysledku
4
n4:pocetUcastnikuAkce
0
n4:pocetZahranicnichUcastnikuAkce
0
n4:rokUplatneniVysledku
n9:2002
n4:tvurceVysledku
Pavelka, Jan Zedníček, Tomáš Dobis, Pavel Šikula, Josef
n4:typAkce
n15:WRD
n4:zahajeniAkce
2002-10-14+02:00
n4:zamer
n12:MSM%20262200022
s:numberOfPages
5
n20:hasPublisher
Electronic Components Institute Internationale, Ltd.
n16:organizacniJednotka
26220