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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F02%3APU29932%21RIV06-GA0-26220___
rdf:type
skos:Concept n21:Vysledek
dcterms:description
This paper contributes to the field of precise electrolytic conductivity measurements with planar sensors. This novel measuring method was suggested for measurement with comb-like thick-film electrodes. Correction characteristics over a wide range of a specific conductivities were determined from an interface impedance characterisation of the thick-film electrodes. The cell constant strongly depends on the frequency and conductivity of solutions. A local minimum of the imaginary part of the interface immpedance is used for corrections to get linear responses. In this minimum a ridge frequency and cell constant were determined for each measured conductivity. An iteration mode of measurements was suggested to exactly measure the conductivity in the ridgefrequency in order to achieve a highly accurate response. An implementation of this method as a microcontroller application can used to build-up microsystems for precise conductivity measurements in concentration ranges from 10-6 to 1 M without cell rep This paper contributes to the field of precise electrolytic conductivity measurements with planar sensors. This novel measuring method was suggested for measurement with comb-like thick-film electrodes. Correction characteristics over a wide range of a specific conductivities were determined from an interface impedance characterisation of the thick-film electrodes. The cell constant strongly depends on the frequency and conductivity of solutions. A local minimum of the imaginary part of the interface iimpedance is used for corrections to get linear responses. In this minimum a ridge frequency and cell constant were determined for each measured conductivity. An iteration mode of measurements was suggested to exactly measure the conductivity in the ridge frequency in order to achieve a highly accurate response. An implementation of this method as a microcontroller application can used to build-up microsystems for precise conductivity measurements in concentration ranges from 10-6 to 1 M without cell re This paper contributes to the field of precise electrolytic conductivity measurements with planar sensors. This novel measuring method was suggested for measurement with comb-like thick-film electrodes. Correction characteristics over a wide range of a specific conductivities were determined from an interface impedance characterisation of the thick-film electrodes. The cell constant strongly depends on the frequency and conductivity of solutions. A local minimum of the imaginary part of the interface iimpedance is used for corrections to get linear responses. In this minimum a ridge frequency and cell constant were determined for each measured conductivity. An iteration mode of measurements was suggested to exactly measure the conductivity in the ridge frequency in order to achieve a highly accurate response. An implementation of this method as a microcontroller application can used to build-up microsystems for precise conductivity measurements in concentration ranges from 10-6 to 1 M without cell re
dcterms:title
New Approach in Wide Range Conductivity Measurement with Planar Sensor New Approach in Wide Range Conductivity Measurement with Planar Sensor New Approach in Wide Range Conductivity Measurement with Planar Sensor
skos:prefLabel
New Approach in Wide Range Conductivity Measurement with Planar Sensor New Approach in Wide Range Conductivity Measurement with Planar Sensor New Approach in Wide Range Conductivity Measurement with Planar Sensor
skos:notation
RIV/00216305:26220/02:PU29932!RIV06-GA0-26220___
n4:strany
112-115
n4:aktivita
n10:Z n10:P
n4:aktivity
P(GA102/00/0939), Z(MSM 262200022)
n4:dodaniDat
n17:2006
n4:domaciTvurceVysledku
n7:3148602 n7:3455599 n7:4489705
n4:druhVysledku
n19:D
n4:duvernostUdaju
n11:S
n4:entitaPredkladatele
n15:predkladatel
n4:idSjednocenehoVysledku
655475
n4:idVysledku
RIV/00216305:26220/02:PU29932
n4:jazykVysledku
n22:eng
n4:klicovaSlova
IDEs, electrolytic conductivity, iterative measurement
n4:klicoveSlovo
n16:electrolytic%20conductivity n16:IDEs n16:iterative%20measurement
n4:kontrolniKodProRIV
[C2BECCC6FEDA]
n4:mistoKonaniAkce
Chania, Crete
n4:mistoVydani
Ing. Z. Novotny, Brno
n4:nazevZdroje
Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design. Chania, Crete (Greece)
n4:obor
n12:JA
n4:pocetDomacichTvurcuVysledku
3
n4:pocetTvurcuVysledku
3
n4:projekt
n18:GA102%2F00%2F0939
n4:rokUplatneniVysledku
n17:2002
n4:tvurceVysledku
Kolařík, Vladimír Krejčí, Jan Hubálek, Jaromír
n4:typAkce
n5:EUR
n4:zahajeniAkce
2002-09-02+02:00
n4:zamer
n13:MSM%20262200022
s:numberOfPages
4
n14:hasPublisher
Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
n8:isbn
80-214-2217-3
n20:organizacniJednotka
26220