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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F02%3APU27779%21RIV%2F2003%2FMSM%2F262203%2FN
rdf:type
skos:Concept n22:Vysledek
dcterms:description
Self-healing processes in tantalum capacitors are investigated and their influence on the value of leakage current and noise parameters evaluated. The kinetic of this regenerative dielectric breakdown is discussed for samples with MnO2 and conducting polymer cathodes. Self-healing processes in tantalum capacitors are investigated and their influence on the value of leakage current and noise parameters evaluated. The kinetic of this regenerative dielectric breakdown is discussed for samples with MnO2 and conducting polymer cathodes.
dcterms:title
Self-Healing Processes in Tantalum Capacitors Self-Healing Processes in Tantalum Capacitors
skos:prefLabel
Self-Healing Processes in Tantalum Capacitors Self-Healing Processes in Tantalum Capacitors
skos:notation
RIV/00216305:26220/02:PU27779!RIV/2003/MSM/262203/N
n3:strany
239-243
n3:aktivita
n6:P n6:Z
n3:aktivity
P(ME 285), Z(MSM 262200022)
n3:dodaniDat
n9:2003
n3:domaciTvurceVysledku
n17:7526938
n3:druhVysledku
n12:D
n3:duvernostUdaju
n19:S
n3:entitaPredkladatele
n14:predkladatel
n3:idSjednocenehoVysledku
663223
n3:idVysledku
RIV/00216305:26220/02:PU27779
n3:jazykVysledku
n11:eng
n3:klicovaSlova
self-healing, noise, tantalum capacitors
n3:klicoveSlovo
n5:tantalum%20capacitors n5:self-healing n5:noise
n3:kontrolniKodProRIV
[9FC0F6D1BD75]
n3:mistoKonaniAkce
FEKT VUT Brno
n3:mistoVydani
Brno
n3:nazevZdroje
Proceedings of Student EEICT 2002
n3:obor
n16:JA
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n4:ME%20285
n3:rokUplatneniVysledku
n9:2002
n3:tvurceVysledku
Pavelka, Jan
n3:typAkce
n15:CST
n3:zahajeniAkce
2002-04-25+02:00
n3:zamer
n18:MSM%20262200022
s:numberOfPages
5
n13:hasPublisher
Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
n21:isbn
80-214-2116-9
n8:organizacniJednotka
26220