This HTML5 document contains 42 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n10http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n12http://purl.org/net/nknouf/ns/bibtex#
n8http://localhost/temp/predkladatel/
n17http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n16http://linked.opendata.cz/resource/domain/vavai/projekt/
n14http://linked.opendata.cz/ontology/domain/vavai/
n11http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216305%3A26220%2F01%3APU23966%21RIV%2F2002%2FMSM%2F262202%2FN/
n21https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n9http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n7http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n20http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n5http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n13http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F01%3APU23966%21RIV%2F2002%2FMSM%2F262202%2FN
rdf:type
skos:Concept n14:Vysledek
dcterms:description
A low frequency noise and charge carriers transport mechanism analysis have been performed on Ta-Ta2O5-MnO2 heterostructures of various thickness to determine the current noise sources. The model of MIS structure can be used to give physical interpretation of VA characteristic both in normal and reverse modes. Correlation between leakage current and noise spectral density was evaluated. A low frequency noise and charge carriers transport mechanism analysis have been performed on Ta-Ta2O5-MnO2 heterostructures of various thickness to determine the current noise sources. The model of MIS structure can be used to give physical interpretation of VA characteristic both in normal and reverse modes. Correlation between leakage current and noise spectral density was evaluated.
dcterms:title
Burst noise in thin amorphous films Burst noise in thin amorphous films
skos:prefLabel
Burst noise in thin amorphous films Burst noise in thin amorphous films
skos:notation
RIV/00216305:26220/01:PU23966!RIV/2002/MSM/262202/N
n3:strany
105-110
n3:aktivita
n20:P
n3:aktivity
P(ME 285)
n3:dodaniDat
n13:2002
n3:domaciTvurceVysledku
n17:7526938
n3:druhVysledku
n18:D
n3:duvernostUdaju
n7:S
n3:entitaPredkladatele
n11:predkladatel
n3:idSjednocenehoVysledku
674786
n3:idVysledku
RIV/00216305:26220/01:PU23966
n3:jazykVysledku
n15:eng
n3:klicovaSlova
burst noise, Ta2O5 films, self-healing
n3:klicoveSlovo
n9:self-healing n9:Ta2O5%20films n9:burst%20noise
n3:kontrolniKodProRIV
[56547815F037]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Brno
n3:nazevZdroje
Sborník příspěvků konference Nové trendy ve fyzice
n3:obor
n5:JA
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n16:ME%20285
n3:rokUplatneniVysledku
n13:2001
n3:tvurceVysledku
Pavelka, Jan
n3:typAkce
n10:EUR
n3:zahajeniAkce
2001-11-15+01:00
s:numberOfPages
6
n12:hasPublisher
Vysoké učení technické v Brně. Fakulta elektrotechniky a informatiky. Ústav fyziky
n21:isbn
80-214-1992-X
n8:organizacniJednotka
26220