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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F01%3APU23964%21RIV%2F2002%2FMSM%2F262202%2FN
rdf:type
n10:Vysledek skos:Concept
dcterms:description
A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum capcitors in order to characterise their quality and reliabilityThe moedl of ta - ta2O5 - MnO2 MIS structure was used to give physical interpretation of VA characteristic noth in normal and reverse modes. The self-healing process based on high temperature MnO2- Mn2O3 transformation was studied and its kinetic determined on the basis of noise spectral density changes. A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum capcitors in order to characterise their quality and reliabilityThe moedl of ta - ta2O5 - MnO2 MIS structure was used to give physical interpretation of VA characteristic noth in normal and reverse modes. The self-healing process based on high temperature MnO2- Mn2O3 transformation was studied and its kinetic determined on the basis of noise spectral density changes.
dcterms:title
Low Frequency Noise of Tantalum Capacitors Low Frequency Noise of Tantalum Capacitors
skos:prefLabel
Low Frequency Noise of Tantalum Capacitors Low Frequency Noise of Tantalum Capacitors
skos:notation
RIV/00216305:26220/01:PU23964!RIV/2002/MSM/262202/N
n3:strany
81-84
n3:aktivita
n20:P
n3:aktivity
P(ME 285)
n3:dodaniDat
n12:2002
n3:domaciTvurceVysledku
n6:9770690 n6:6541763 n6:7526938 n6:9006753 n6:2108585
n3:druhVysledku
n5:D
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
685565
n3:idVysledku
RIV/00216305:26220/01:PU23964
n3:jazykVysledku
n9:eng
n3:klicovaSlova
Noise, tantalum capcitors, self-healing, reliability
n3:klicoveSlovo
n7:self-healing n7:reliability n7:tantalum%20capcitors n7:Noise
n3:kontrolniKodProRIV
[FA99BB156C76]
n3:mistoKonaniAkce
Kodaň
n3:mistoVydani
Kodaň, Dánsko
n3:nazevZdroje
Proceedings of CARTS-Euro 2001
n3:obor
n16:JA
n3:pocetDomacichTvurcuVysledku
5
n3:pocetTvurcuVysledku
7
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n11:ME%20285
n3:rokUplatneniVysledku
n12:2001
n3:tvurceVysledku
Hlávka, Jan Pavelka, Jan Grmela, Lubomír Šikula, Josef Hashiguchi, Sumihisa Sedláková, Vlasta Tacano, Munecazu
n3:typAkce
n4:WRD
n3:zahajeniAkce
2001-10-15+02:00
s:numberOfPages
4
n19:hasPublisher
Electronic Components Institute Internationale Ltd.
n13:organizacniJednotka
26220