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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F01%3APU21505%21RIV%2F2002%2FMSM%2F262202%2FN
rdf:type
skos:Concept n20:Vysledek
dcterms:description
A low frequency noise and charge carriers transport mechanism analysis have been performed on Ta - Ta2O5 - MnO2 heterostructures of various thickness to determine the current noise sources. The model of MIS structure can be used to give physical interpretation of VA characteristic both in normal and reverse modes. The self-healing process based on the high temeprature MnO2 - Mn2O3 transformation was studied and its kinetic determined on the basis of noise spectral density changes. The correlation betweeen leakage current and noise spectral density was evaluated. A low frequency noise and charge carriers transport mechanism analysis have been performed on Ta - Ta2O5 - MnO2 heterostructures of various thickness to determine the current noise sources. The model of MIS structure can be used to give physical interpretation of VA characteristic both in normal and reverse modes. The self-healing process based on the high temeprature MnO2 - Mn2O3 transformation was studied and its kinetic determined on the basis of noise spectral density changes. The correlation betweeen leakage current and noise spectral density was evaluated.
dcterms:title
Low Frequency Noise of Thin Ta2O5 Amorphous Films Low Frequency Noise of Thin Ta2O5 Amorphous Films
skos:prefLabel
Low Frequency Noise of Thin Ta2O5 Amorphous Films Low Frequency Noise of Thin Ta2O5 Amorphous Films
skos:notation
RIV/00216305:26220/01:PU21505!RIV/2002/MSM/262202/N
n5:strany
91-94
n5:aktivita
n12:P
n5:aktivity
P(ME 285)
n5:dodaniDat
n9:2002
n5:domaciTvurceVysledku
n6:9770690 n6:6541763 n6:7526938 n6:2108585
n5:druhVysledku
n8:D
n5:duvernostUdaju
n13:S
n5:entitaPredkladatele
n17:predkladatel
n5:idSjednocenehoVysledku
685566
n5:idVysledku
RIV/00216305:26220/01:PU21505
n5:jazykVysledku
n21:eng
n5:klicovaSlova
low frequency noise, tantalum pentoxide, self-healing, reliability
n5:klicoveSlovo
n7:self-healing n7:low%20frequency%20noise n7:reliability n7:tantalum%20pentoxide
n5:kontrolniKodProRIV
[257999BB3CAF]
n5:mistoKonaniAkce
Gainesville Florida USA
n5:mistoVydani
Gainesville, Florida, USA
n5:nazevZdroje
Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001
n5:obor
n11:JA
n5:pocetDomacichTvurcuVysledku
4
n5:pocetTvurcuVysledku
6
n5:pocetUcastnikuAkce
0
n5:pocetZahranicnichUcastnikuAkce
0
n5:projekt
n15:ME%20285
n5:rokUplatneniVysledku
n9:2001
n5:tvurceVysledku
Pavelka, Jan Tacano, Munecazu Sedláková, Vlasta Grmela, Lubomír Šikula, Josef Hashiguchi, Sumihisa
n5:typAkce
n19:WRD
n5:zahajeniAkce
2001-10-22+02:00
s:numberOfPages
4
n14:hasPublisher
World Scientific
n18:isbn
981-02-4677-3
n10:organizacniJednotka
26220