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Statements

Subject Item
n2:RIV%2F00216305%3A26210%2F10%3APU89901%21RIV11-MSM-26210___
rdf:type
n9:Vysledek skos:Concept
dcterms:description
The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged. The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged.
dcterms:title
Strain mapping by Scanning Low Energy Electron Microscopy Strain mapping by Scanning Low Energy Electron Microscopy
skos:prefLabel
Strain mapping by Scanning Low Energy Electron Microscopy Strain mapping by Scanning Low Energy Electron Microscopy
skos:notation
RIV/00216305:26210/10:PU89901!RIV11-MSM-26210___
n3:aktivita
n11:Z n11:S
n3:aktivity
S, Z(MSM0021630508)
n3:cisloPeriodika
-
n3:dodaniDat
n10:2011
n3:domaciTvurceVysledku
n5:9380531 n5:6440959 n5:5357020 n5:6142826
n3:druhVysledku
n15:J
n3:duvernostUdaju
n8:S
n3:entitaPredkladatele
n18:predkladatel
n3:idSjednocenehoVysledku
290201
n3:idVysledku
RIV/00216305:26210/10:PU89901
n3:jazykVysledku
n14:eng
n3:klicovaSlova
scanning low energy electron microscopy (SLEEM), contrast of crystal orientation, microscopic strain
n3:klicoveSlovo
n13:scanning%20low%20energy%20electron%20microscopy%20%28SLEEM%29 n13:contrast%20of%20crystal%20orientation n13:microscopic%20strain
n3:kodStatuVydavatele
CH - Švýcarská konfederace
n3:kontrolniKodProRIV
[3E0D5F23411D]
n3:nazevZdroje
Key Engineering Materials
n3:obor
n17:JG
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
7
n3:rokUplatneniVysledku
n10:2010
n3:svazekPeriodika
465
n3:tvurceVysledku
Hovorka, Miloš Pantělejev, Libor Frank, Luděk Man, Ondřej Müllerová, Ilona Mikmeková, Šárka Kouřil, Miloslav
n3:zamer
n16:MSM0021630508
s:issn
1662-9795
s:numberOfPages
4
n6:organizacniJednotka
26210