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Statements

Subject Item
n2:RIV%2F00216305%3A26210%2F10%3APU87809%21RIV12-MSM-26210___
rdf:type
n16:Vysledek skos:Concept
dcterms:description
Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted. Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted.
dcterms:title
Application of FIB technique to study of early fatigue damage in polycrystals Application of FIB technique to study of early fatigue damage in polycrystals
skos:prefLabel
Application of FIB technique to study of early fatigue damage in polycrystals Application of FIB technique to study of early fatigue damage in polycrystals
skos:notation
RIV/00216305:26210/10:PU87809!RIV12-MSM-26210___
n4:aktivita
n12:Z n12:S n12:P
n4:aktivity
P(1QS200410502), P(GA101/07/1500), P(GA106/06/1096), S, Z(AV0Z20410507)
n4:cisloPeriodika
1
n4:dodaniDat
n7:2012
n4:domaciTvurceVysledku
n17:7955995 n17:5413206
n4:druhVysledku
n5:J
n4:duvernostUdaju
n9:S
n4:entitaPredkladatele
n15:predkladatel
n4:idSjednocenehoVysledku
247420
n4:idVysledku
RIV/00216305:26210/10:PU87809
n4:jazykVysledku
n18:eng
n4:klicovaSlova
focused ion beam, fatigue crack initiation, extrusion, intrusion
n4:klicoveSlovo
n10:extrusion n10:fatigue%20crack%20initiation n10:focused%20ion%20beam n10:intrusion
n4:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n4:kontrolniKodProRIV
[7E1F2BD7D69F]
n4:nazevZdroje
Journal of Physics: Conference Series
n4:obor
n13:JL
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
6
n4:projekt
n14:1QS200410502 n14:GA101%2F07%2F1500 n14:GA106%2F06%2F1096
n4:rokUplatneniVysledku
n7:2010
n4:svazekPeriodika
240
n4:tvurceVysledku
Vystavěl, Tomáš Man, Jiří Skrotzki, Werner Polák, Jaroslav Kuběna, Ivo Weidner, Anja
n4:zamer
n19:AV0Z20410507
s:issn
1742-6588
s:numberOfPages
4
n8:organizacniJednotka
26210