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Statements

Subject Item
n2:RIV%2F00216305%3A26210%2F10%3APU85238%21RIV11-MSM-26210___
rdf:type
skos:Concept n19:Vysledek
dcterms:description
Study of the grain structure in the equal channel angular pressing processed copper by means of the cathode lens equipped ultrahigh vacuum scanning low energy electron microscope is reported. The grain contrast was found achieving its maximum at electron energies below about 30 eV where it alternated its sign and exhibited dependence on electron energy specific for the grain orientation. The energy dependence of the electron reflectance seemed to be capable of serving as a fingerprint enabling determination of the crystalline orientation. In the cathode lens mode at hundreds of eV fine details of the microstructure are also observable including twins and low angle grain boundaries. This is explained by acquisition of high-angle backscattered slow electrons, normally not acquired in standard scanning electron microscopes. The very low energy electron reflectance is promising as an alternative to the EBSD method owing to its high resolution and fast data acquisition. Study of the grain structure in the equal channel angular pressing processed copper by means of the cathode lens equipped ultrahigh vacuum scanning low energy electron microscope is reported. The grain contrast was found achieving its maximum at electron energies below about 30 eV where it alternated its sign and exhibited dependence on electron energy specific for the grain orientation. The energy dependence of the electron reflectance seemed to be capable of serving as a fingerprint enabling determination of the crystalline orientation. In the cathode lens mode at hundreds of eV fine details of the microstructure are also observable including twins and low angle grain boundaries. This is explained by acquisition of high-angle backscattered slow electrons, normally not acquired in standard scanning electron microscopes. The very low energy electron reflectance is promising as an alternative to the EBSD method owing to its high resolution and fast data acquisition.
dcterms:title
Grain Contrast Imaging in UHV SLEEM Grain Contrast Imaging in UHV SLEEM
skos:prefLabel
Grain Contrast Imaging in UHV SLEEM Grain Contrast Imaging in UHV SLEEM
skos:notation
RIV/00216305:26210/10:PU85238!RIV11-MSM-26210___
n3:aktivita
n10:S n10:P n10:Z
n3:aktivity
P(OE08012), S, Z(AV0Z20650511), Z(MSM0021630508)
n3:cisloPeriodika
2
n3:dodaniDat
n8:2011
n3:domaciTvurceVysledku
n12:6440959 n12:5357020 n12:6142826
n3:druhVysledku
n16:J
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n11:predkladatel
n3:idSjednocenehoVysledku
260946
n3:idVysledku
RIV/00216305:26210/10:PU85238
n3:jazykVysledku
n6:eng
n3:klicovaSlova
scanning low energy electron microscopy, electron backscatter diffraction (EBSD), grain contrast, ultra-fine grained materials
n3:klicoveSlovo
n15:scanning%20low%20energy%20electron%20microscopy n15:grain%20contrast n15:electron%20backscatter%20diffraction%20%28EBSD%29 n15:ultra-fine%20grained%20materials
n3:kodStatuVydavatele
JP - Japonsko
n3:kontrolniKodProRIV
[932F57A8B059]
n3:nazevZdroje
MATERIALS TRANSACTIONS
n3:obor
n5:JG
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
6
n3:projekt
n14:OE08012
n3:rokUplatneniVysledku
n8:2010
n3:svazekPeriodika
51
n3:tvurceVysledku
Mikmeková, Šárka Man, Ondřej Frank, Luděk Hovorka, Miloš Pantělejev, Libor Müllerová, Ilona
n3:zamer
n17:AV0Z20650511 n17:MSM0021630508
s:issn
1345-9678
s:numberOfPages
5
n9:organizacniJednotka
26210