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Subject Item
n2:RIV%2F00216305%3A26210%2F00%3A00000107%21RIV%2F2001%2FMSM%2F262101%2FN
rdf:type
skos:Concept n14:Vysledek
dcterms:description
This study presents such a modification of colorimetric interferometry technique using dichromatic light source instead of white light and new refractive index correction algorithm combining Lorenz-Lorentz equation with density pressure equation and pressure distribution calculated from measured film thickness map. The efficiency of this technique has been tested through the observation of EHD film shapes under disc sliding conditions when a deep conical depression (dimple) appears within the contact area. Obtained results have proved that with the use of dichromatic colorimetric interferometry it is possible to obtain precise EHD film shapes for film thicknesses up to 1 500 nm with film thickness resolution approx. 1 nm and measurement accuracy 3 nm. This study presents such a modification of colorimetric interferometry technique using dichromatic light source instead of white light and new refractive index correction algorithm combining Lorenz-Lorentz equation with density pressure equation and pressure distribution calculated from measured film thickness map. The efficiency of this technique has been tested through the observation of EHD film shapes under disc sliding conditions when a deep conical depression (dimple) appears within the contact area. Obtained results have proved that with the use of dichromatic colorimetric interferometry it is possible to obtain precise EHD film shapes for film thicknesses up to 1 500 nm with film thickness resolution approx. 1 nm and measurement accuracy 3 nm.
dcterms:title
Dimple phenomena study by dichromatic colorimetric interferometry Dimple phenomena study by dichromatic colorimetric interferometry
skos:prefLabel
Dimple phenomena study by dichromatic colorimetric interferometry Dimple phenomena study by dichromatic colorimetric interferometry
skos:notation
RIV/00216305:26210/00:00000107!RIV/2001/MSM/262101/N
n3:strany
982.543945
n3:aktivita
n6:Z n6:P
n3:aktivity
P(ME 182), Z(MSM 262100002)
n3:dodaniDat
n15:2001
n3:domaciTvurceVysledku
Hartl, Martin Liška, Miroslav Poliščuk, Radek Křupka, Ivan
n3:druhVysledku
n12:D
n3:duvernostUdaju
n17:S
n3:entitaPredkladatele
n10:predkladatel
n3:idSjednocenehoVysledku
708846
n3:idVysledku
RIV/00216305:26210/00:00000107
n3:jazykVysledku
n8:eng
n3:klicovaSlova
dimple phenomena; colorimetry; film thickness
n3:klicoveSlovo
n9:film%20thickness n9:colorimetry n9:dimple%20phenomena
n3:kontrolniKodProRIV
[B4BE70B48AC3]
n3:mistoVydani
Nagasaki, Japan
n3:nazevZdroje
International Tribology Conference ITC Nagasaki 2000
n3:obor
n18:JR
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
7
n3:projekt
n11:ME%20182
n3:rokUplatneniVysledku
n15:2000
n3:tvurceVysledku
Kaneta, Motohiro Poliščuk, Radek Liška, Miroslav Hartl, Martin Matsuda, Kenji Křupka, Ivan Nishikawa, Humisex
n3:zamer
n19:MSM%20262100002
s:numberOfPages
1
n16:hasPublisher
Japanese Society of Tribologists
n7:organizacniJednotka
26210