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Namespace Prefixes

PrefixIRI
n14http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n16http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216305%3A26110%2F07%3APU80680%21RIV10-GA0-26110___/
n17http://localhost/temp/predkladatel/
n11http://purl.org/net/nknouf/ns/bibtex#
n20http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n7http://linked.opendata.cz/resource/domain/vavai/projekt/
n4http://linked.opendata.cz/ontology/domain/vavai/
n19https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n5http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n21http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n13http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n10http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n9http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216305%3A26110%2F07%3APU80680%21RIV10-GA0-26110___
rdf:type
n4:Vysledek skos:Concept
dcterms:description
Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones. Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones.
dcterms:title
Noise Reliability Indicators for Films Resistors Noise Reliability Indicators for Films Resistors
skos:prefLabel
Noise Reliability Indicators for Films Resistors Noise Reliability Indicators for Films Resistors
skos:notation
RIV/00216305:26110/07:PU80680!RIV10-GA0-26110___
n3:aktivita
n21:P
n3:aktivity
P(GA102/99/0953), P(GA103/06/0708)
n3:dodaniDat
n9:2010
n3:domaciTvurceVysledku
n20:7502222
n3:druhVysledku
n10:D
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
437432
n3:idVysledku
RIV/00216305:26110/07:PU80680
n3:jazykVysledku
n13:eng
n3:klicovaSlova
Noise, Reliability, Indicator, Film Resistor
n3:klicoveSlovo
n5:Noise n5:Indicator n5:Reliability n5:Film%20Resistor
n3:kontrolniKodProRIV
[7131879E034B]
n3:mistoKonaniAkce
Velke Losiny
n3:mistoVydani
Brno
n3:nazevZdroje
Physical and Material Engineering 2007
n3:obor
n18:JA
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:projekt
n7:GA103%2F06%2F0708 n7:GA102%2F99%2F0953
n3:rokUplatneniVysledku
n9:2007
n3:tvurceVysledku
Schauer, Pavel
n3:typAkce
n14:EUR
n3:zahajeniAkce
2007-09-04+02:00
s:numberOfPages
4
n11:hasPublisher
Akademické nakladatelství CERM
n19:isbn
978-80-7204-537-2
n17:organizacniJednotka
26110