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Statements

Subject Item
n2:RIV%2F00216275%3A25510%2F11%3A39892706%21RIV12-MSM-25510___
rdf:type
skos:Concept n4:Vysledek
dcterms:description
The article deals with the preparation and execution of the drop test of the electron microscope assembly. Based on the finite element method (FEM), the simplified numerical model of the assembly is created for this purpose. The aim of the nonlinear dynamic analysis has been to obtain the size and direction of maximum inertia forces in the system during the simulated impact of the model on basis. Calculated values are verified by actual drop tests of the assembly. Theoretical results are re-adjusted according to the test results. The conditions of the drop tests are governed by the internal regulations of the manufacturer. Based on the knowledge of the actual load, the load carrying structural parts of the assembly (supporting frame, horizontal frame) may be properly designed. Sufficient strength and rigidity must be guaranteed especially with regard to the transportation where rough treatment can be expected. The article deals with the preparation and execution of the drop test of the electron microscope assembly. Based on the finite element method (FEM), the simplified numerical model of the assembly is created for this purpose. The aim of the nonlinear dynamic analysis has been to obtain the size and direction of maximum inertia forces in the system during the simulated impact of the model on basis. Calculated values are verified by actual drop tests of the assembly. Theoretical results are re-adjusted according to the test results. The conditions of the drop tests are governed by the internal regulations of the manufacturer. Based on the knowledge of the actual load, the load carrying structural parts of the assembly (supporting frame, horizontal frame) may be properly designed. Sufficient strength and rigidity must be guaranteed especially with regard to the transportation where rough treatment can be expected.
dcterms:title
Detail Theoretical Preparation of the Drop Test of an Electron Microscope. Detail Theoretical Preparation of the Drop Test of an Electron Microscope.
skos:prefLabel
Detail Theoretical Preparation of the Drop Test of an Electron Microscope. Detail Theoretical Preparation of the Drop Test of an Electron Microscope.
skos:notation
RIV/00216275:25510/11:39892706!RIV12-MSM-25510___
n4:predkladatel
n5:orjk%3A25510
n3:aktivita
n10:P
n3:aktivity
P(1M0519)
n3:dodaniDat
n19:2012
n3:domaciTvurceVysledku
n12:8781117
n3:druhVysledku
n14:D
n3:duvernostUdaju
n22:S
n3:entitaPredkladatele
n15:predkladatel
n3:idSjednocenehoVysledku
193664
n3:idVysledku
RIV/00216275:25510/11:39892706
n3:jazykVysledku
n18:eng
n3:klicovaSlova
Inertial forces; Horizontal frame; Supporting frame; Dummy body; Electron microscope; Drop test
n3:klicoveSlovo
n17:Drop%20test n17:Horizontal%20frame n17:Inertial%20forces n17:Electron%20microscope n17:Supporting%20frame n17:Dummy%20body
n3:kontrolniKodProRIV
[C746809CF881]
n3:mistoKonaniAkce
Praha
n3:mistoVydani
Berlin
n3:nazevZdroje
Vibration Problems ICOVP 2011
n3:obor
n20:JS
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
2
n3:projekt
n7:1M0519
n3:rokUplatneniVysledku
n19:2011
n3:tvurceVysledku
Kanický, Viktor Paščenko, Petr
n3:typAkce
n6:EUR
n3:zahajeniAkce
2011-09-05+02:00
s:issn
0930-8989
s:numberOfPages
13
n9:hasPublisher
Springer-Verlag
n21:isbn
978-94-007-2068-8
n16:organizacniJednotka
25510