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Statements

Subject Item
n2:RIV%2F00216275%3A25310%2F09%3A00008349%21RIV10-MSM-25310___
rdf:type
n4:Vysledek skos:Concept
dcterms:description
Optical characterization of As12.6Ge23.8S63.6 thin films was made from transmission spectra measurements using Swanepoel method. Spectral dependences of refractive index were well described by single oscillator model. Raman spectra of initial bulk glasses and evaporated films have shown the presence of the nanoscale intrinsic heterogeneities. Nonlinear optical properties of the films were estimated from optical parameters using different approaches and they were found to be more than two orders of magnitude higher then those of silica glasses Optical characterization of As12.6Ge23.8S63.6 thin films was made from transmission spectra measurements using Swanepoel method. Spectral dependences of refractive index were well described by single oscillator model. Raman spectra of initial bulk glasses and evaporated films have shown the presence of the nanoscale intrinsic heterogeneities. Nonlinear optical properties of the films were estimated from optical parameters using different approaches and they were found to be more than two orders of magnitude higher then those of silica glasses
dcterms:title
Optical characterization of As-Ge-S thin films Optical characterization of As-Ge-S thin films
skos:prefLabel
Optical characterization of As-Ge-S thin films Optical characterization of As-Ge-S thin films
skos:notation
RIV/00216275:25310/09:00008349!RIV10-MSM-25310___
n5:aktivita
n15:Z
n5:aktivity
Z(MSM0021627501)
n5:cisloPeriodika
11
n5:dodaniDat
n13:2010
n5:domaciTvurceVysledku
n12:1620290
n5:druhVysledku
n9:J
n5:duvernostUdaju
n16:S
n5:entitaPredkladatele
n11:predkladatel
n5:idSjednocenehoVysledku
331805
n5:idVysledku
RIV/00216275:25310/09:00008349
n5:jazykVysledku
n10:eng
n5:klicovaSlova
optical properties; chalcogenide glass; refractive index; optical nonlinearity
n5:klicoveSlovo
n7:optical%20properties n7:refractive%20index n7:optical%20nonlinearity n7:chalcogenide%20glass
n5:kodStatuVydavatele
RO - Rumunsko
n5:kontrolniKodProRIV
[5D8A093FE603]
n5:nazevZdroje
Journal of Optoelectronics and Advanced Materials
n5:obor
n14:CA
n5:pocetDomacichTvurcuVysledku
1
n5:pocetTvurcuVysledku
4
n5:rokUplatneniVysledku
n13:2009
n5:svazekPeriodika
11
n5:tvurceVysledku
Stronski, A. V. Pribylova, H. Tolmachov, I. D. Vlček, Miroslav
n5:zamer
n6:MSM0021627501
s:issn
1454-4164
s:numberOfPages
5
n18:organizacniJednotka
25310