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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F14%3A00079589%21RIV15-MSM-14310___
rdf:type
skos:Concept n19:Vysledek
rdfs:seeAlso
http://ac.els-cdn.com/S0040609013020580/1-s2.0-S0040609013020580-main.pdf?_tid=9dc4242c-cd4e-11e4-81d3-00000aab0f27&acdnat=1426670006_2cfda1649715e3b4127d412cee6b028a
dcterms:description
Different types of broadening of the dielectric response are studied with respect to the preservation of the Thomas-Reiche-Kuhn sum rule. It is found that only the broadening of the dielectric function and transition strength function conserve this sum rule, whereas the broadening of the transition probability function (joint density of states) increases or decreases the sum. The effect of different kinds of broadening is demonstrated for interband and intraband direct electronic transitions using simplified rectangular models. It is shown that the broadening of the dielectric function is more suitable for interband transitions while broadening of the transition strength function is more suitable for intraband transitions. (C) 2013 Elsevier B.V. All rights reserved. Different types of broadening of the dielectric response are studied with respect to the preservation of the Thomas-Reiche-Kuhn sum rule. It is found that only the broadening of the dielectric function and transition strength function conserve this sum rule, whereas the broadening of the transition probability function (joint density of states) increases or decreases the sum. The effect of different kinds of broadening is demonstrated for interband and intraband direct electronic transitions using simplified rectangular models. It is shown that the broadening of the dielectric function is more suitable for interband transitions while broadening of the transition strength function is more suitable for intraband transitions. (C) 2013 Elsevier B.V. All rights reserved.
dcterms:title
Broadening of dielectric response and sum rule conservation Broadening of dielectric response and sum rule conservation
skos:prefLabel
Broadening of dielectric response and sum rule conservation Broadening of dielectric response and sum rule conservation
skos:notation
RIV/00216224:14310/14:00079589!RIV15-MSM-14310___
n3:aktivita
n17:P
n3:aktivity
P(ED1.1.00/02.0068), P(ED2.1.00/03.0086)
n3:cisloPeriodika
November
n3:dodaniDat
n14:2015
n3:domaciTvurceVysledku
n10:2026384 n10:4205448 n10:5870879 n10:9412921
n3:druhVysledku
n18:J
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n8:predkladatel
n3:idSjednocenehoVysledku
5855
n3:idVysledku
RIV/00216224:14310/14:00079589
n3:jazykVysledku
n4:eng
n3:klicovaSlova
Dielectric response; Dispersion model; Broadening; Sum rule
n3:klicoveSlovo
n7:Dispersion%20model n7:Sum%20rule n7:Broadening n7:Dielectric%20response
n3:kodStatuVydavatele
CH - Švýcarská konfederace
n3:kontrolniKodProRIV
[50582EDCACD5]
n3:nazevZdroje
Thin Solid Films
n3:obor
n9:BM
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
4
n3:projekt
n5:ED1.1.00%2F02.0068 n5:ED2.1.00%2F03.0086
n3:rokUplatneniVysledku
n14:2014
n3:svazekPeriodika
571
n3:tvurceVysledku
Franta, Daniel Zajíčková, Lenka Ohlídal, Ivan Nečas, David
n3:wos
000346055200028
s:issn
0040-6090
s:numberOfPages
6
n20:doi
10.1016/j.tsf.2013.11.148
n12:organizacniJednotka
14310