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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F11%3A00053215%21RIV12-MSM-14310___
rdf:type
skos:Concept n3:Vysledek
dcterms:description
The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be +/- 10%. The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be +/- 10%.
dcterms:title
Spectroscopic ellipsometry of few-layer graphene Spectroscopic ellipsometry of few-layer graphene
skos:prefLabel
Spectroscopic ellipsometry of few-layer graphene Spectroscopic ellipsometry of few-layer graphene
skos:notation
RIV/00216224:14310/11:00053215!RIV12-MSM-14310___
n3:predkladatel
n4:orjk%3A14310
n5:aktivita
n15:Z
n5:aktivity
Z(MSM0021622410)
n5:cisloPeriodika
1
n5:dodaniDat
n9:2012
n5:domaciTvurceVysledku
n13:1834282
n5:druhVysledku
n18:J
n5:duvernostUdaju
n14:S
n5:entitaPredkladatele
n17:predkladatel
n5:idSjednocenehoVysledku
231387
n5:idVysledku
RIV/00216224:14310/11:00053215
n5:jazykVysledku
n6:eng
n5:klicovaSlova
graphene; ellipsometry; island film model
n5:klicoveSlovo
n11:island%20film%20model n11:graphene n11:ellipsometry
n5:kodStatuVydavatele
US - Spojené státy americké
n5:kontrolniKodProRIV
[67135C9D7638]
n5:nazevZdroje
Journal of Nanophotonics
n5:obor
n8:BM
n5:pocetDomacichTvurcuVysledku
1
n5:pocetTvurcuVysledku
15
n5:rokUplatneniVysledku
n9:2011
n5:svazekPeriodika
5
n5:tvurceVysledku
Bergmair, Iris Petrovic, Zoran Jakovljevic, Milka Gajic, Rados Isic, Goran Humlíček, Josef Filipovic, Marko Lazovic, Sasa Jovanovic, Djordje Kostic, Radmila Bruno, Giovanni Hingerlt, Kurt Puac, Nevena Losurdo, Maria Vasic, Borislav
n5:wos
000291649600001
n5:zamer
n16:MSM0021622410
s:issn
1934-2608
s:numberOfPages
7
n12:doi
10.1117/1.3598162
n20:organizacniJednotka
14310