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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F11%3A00053212%21RIV12-MSM-14310___
rdf:type
skos:Concept n7:Vysledek
dcterms:description
Suitable combinations of the optical response and geometrical form of flat or curved interfaces of the constituents in nanometer-sized metamaterials can lead to a strong enhancement of local fields, seen typically as sharp spectral resonances in optical spectra. We propose a classification of the resonant phenomena in inhomogeneous systems within the effective-medium approximation, and examine their manifestation in infrared ellipsometry. We report mid-infrared ellipsometric spectra of a doped semiconductor metamaterial, exhibiting negative refraction. We provide a simple explanation for the difference in the directions of the phase- and energy propagation. The resonance responsible for a strong anisotropy and the interesting behavior of refracted light is found to lead to characteristic features in the ellipsometric spectra. Suitable combinations of the optical response and geometrical form of flat or curved interfaces of the constituents in nanometer-sized metamaterials can lead to a strong enhancement of local fields, seen typically as sharp spectral resonances in optical spectra. We propose a classification of the resonant phenomena in inhomogeneous systems within the effective-medium approximation, and examine their manifestation in infrared ellipsometry. We report mid-infrared ellipsometric spectra of a doped semiconductor metamaterial, exhibiting negative refraction. We provide a simple explanation for the difference in the directions of the phase- and energy propagation. The resonance responsible for a strong anisotropy and the interesting behavior of refracted light is found to lead to characteristic features in the ellipsometric spectra.
dcterms:title
Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials
skos:prefLabel
Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials
skos:notation
RIV/00216224:14310/11:00053212!RIV12-MSM-14310___
n7:predkladatel
n8:orjk%3A14310
n3:aktivita
n12:Z
n3:aktivity
Z(MSM0021622410)
n3:cisloPeriodika
9
n3:dodaniDat
n14:2012
n3:domaciTvurceVysledku
n5:1834282
n3:druhVysledku
n13:J
n3:duvernostUdaju
n11:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
204821
n3:idVysledku
RIV/00216224:14310/11:00053212
n3:jazykVysledku
n16:eng
n3:klicovaSlova
Ellipsometry; Infrared; Metamaterials
n3:klicoveSlovo
n10:Metamaterials n10:Ellipsometry n10:Infrared
n3:kodStatuVydavatele
CH - Švýcarská konfederace
n3:kontrolniKodProRIV
[7BAF2600600F]
n3:nazevZdroje
Thin Solid Films
n3:obor
n4:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:rokUplatneniVysledku
n14:2011
n3:svazekPeriodika
519
n3:tvurceVysledku
Humlíček, Josef
n3:wos
000289174200019
n3:zamer
n15:MSM0021622410
s:issn
0040-6090
s:numberOfPages
4
n20:doi
10.1016/j.tsf.2010.12.055
n18:organizacniJednotka
14310