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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F11%3A00050716%21RIV12-MPO-14310___
rdf:type
skos:Concept n3:Vysledek
dcterms:description
The combination of spectrophotometry and variable-angle spectroscopic ellipsometry is used for the optical characterization of a system consisting of transparent polymer film on a transparent polycarbonate substrate. In the region of sample transparency a relatively large depolarization is observed in ellipsometry. This can be explained by the presence of anisotropy in the film or substrate. The possibility of distinguishing between the depolarization enhanced by film and substrate anisotropy is discussed and tested using several models. It is shown that it is not possible to distinguish between these effects. The combination of spectrophotometry and variable-angle spectroscopic ellipsometry is used for the optical characterization of a system consisting of transparent polymer film on a transparent polycarbonate substrate. In the region of sample transparency a relatively large depolarization is observed in ellipsometry. This can be explained by the presence of anisotropy in the film or substrate. The possibility of distinguishing between the depolarization enhanced by film and substrate anisotropy is discussed and tested using several models. It is shown that it is not possible to distinguish between these effects.
dcterms:title
Anisotropy-enhanced depolarization on transparent film/substrate system Anisotropy-enhanced depolarization on transparent film/substrate system
skos:prefLabel
Anisotropy-enhanced depolarization on transparent film/substrate system Anisotropy-enhanced depolarization on transparent film/substrate system
skos:notation
RIV/00216224:14310/11:00050716!RIV12-MPO-14310___
n3:predkladatel
n4:orjk%3A14310
n5:aktivita
n10:Z n10:P
n5:aktivity
P(FR-TI1/168), Z(MSM0021622411)
n5:cisloPeriodika
9
n5:dodaniDat
n13:2012
n5:domaciTvurceVysledku
n12:2026384 n12:9412921 n12:5870879
n5:druhVysledku
n21:J
n5:duvernostUdaju
n9:S
n5:entitaPredkladatele
n17:predkladatel
n5:idSjednocenehoVysledku
186308
n5:idVysledku
RIV/00216224:14310/11:00050716
n5:jazykVysledku
n16:eng
n5:klicovaSlova
anisotropy; depolarization; optical properties; ellipsometry
n5:klicoveSlovo
n6:anisotropy n6:optical%20properties n6:ellipsometry n6:depolarization
n5:kodStatuVydavatele
NL - Nizozemsko
n5:kontrolniKodProRIV
[4F69580884FC]
n5:nazevZdroje
Thin Solid Films
n5:obor
n18:BH
n5:pocetDomacichTvurcuVysledku
3
n5:pocetTvurcuVysledku
3
n5:projekt
n11:FR-TI1%2F168
n5:rokUplatneniVysledku
n13:2011
n5:svazekPeriodika
519
n5:tvurceVysledku
Franta, Daniel Ohlídal, Ivan Nečas, David
n5:wos
000289174200015
n5:zamer
n15:MSM0021622411
s:issn
0040-6090
s:numberOfPages
4
n19:doi
10.1016/j.tsf.2010.12.113
n20:organizacniJednotka
14310