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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F10%3A00046560%21RIV11-GA0-14310___
rdf:type
n5:Vysledek skos:Concept
dcterms:description
As a part of a complex study of nucleation and growth of oxygen precipitates in Czochralski-grown silicon this work reports our latest results obtained by TEM. As a part of a complex study of nucleation and growth of oxygen precipitates in Czochralski-grown silicon this work reports our latest results obtained by TEM.
dcterms:title
Defect Engineering in Czochralski-grown Silicon Studied by TEM Defect Engineering in Czochralski-grown Silicon Studied by TEM
skos:prefLabel
Defect Engineering in Czochralski-grown Silicon Studied by TEM Defect Engineering in Czochralski-grown Silicon Studied by TEM
skos:notation
RIV/00216224:14310/10:00046560!RIV11-GA0-14310___
n3:aktivita
n14:Z n14:P
n3:aktivity
P(GA202/09/1013), Z(MSM0021622410)
n3:dodaniDat
n11:2011
n3:domaciTvurceVysledku
n6:1852558 n6:3375390 n6:7105711 n6:6334008
n3:druhVysledku
n18:O
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n8:predkladatel
n3:idSjednocenehoVysledku
253095
n3:idVysledku
RIV/00216224:14310/10:00046560
n3:jazykVysledku
n4:eng
n3:klicovaSlova
oxygen precipitates; silicon; electron microscopy
n3:klicoveSlovo
n12:electron%20microscopy n12:silicon n12:oxygen%20precipitates
n3:kontrolniKodProRIV
[3ECC70911EB7]
n3:obor
n9:BM
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
5
n3:projekt
n7:GA202%2F09%2F1013
n3:rokUplatneniVysledku
n11:2010
n3:tvurceVysledku
Buršík, Jiří Caha, Ondřej Kuběna, Josef Meduňa, Mojmír Svoboda, Milan
n3:zamer
n17:MSM0021622410
n13:organizacniJednotka
14310