This HTML5 document contains 55 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
dctermshttp://purl.org/dc/terms/
n15http://localhost/temp/predkladatel/
n5http://linked.opendata.cz/resource/domain/vavai/projekt/
n4http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n18http://linked.opendata.cz/ontology/domain/vavai/
n17http://linked.opendata.cz/resource/domain/vavai/zamer/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n19http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216224%3A14310%2F09%3A00028505%21RIV10-MSM-14310___/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n9http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n7http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n16http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n13http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n14http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n8http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n10http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F09%3A00028505%21RIV10-MSM-14310___
rdf:type
skos:Concept n18:Vysledek
dcterms:description
Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement. Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement.
dcterms:title
Optical Characterization of Ultra-Thin Iron and Iron Oxide Films Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
skos:prefLabel
Optical Characterization of Ultra-Thin Iron and Iron Oxide Films Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
skos:notation
RIV/00216224:14310/09:00028505!RIV10-MSM-14310___
n3:aktivita
n13:Z n13:P
n3:aktivity
P(KAN311610701), Z(MSM0021622410), Z(MSM0021622411)
n3:cisloPeriodika
březen
n3:dodaniDat
n10:2010
n3:domaciTvurceVysledku
n4:1462202 n4:2966174 n4:4205448 n4:1852558 n4:9412921 n4:5870879 n4:1739948
n3:druhVysledku
n14:J
n3:duvernostUdaju
n7:S
n3:entitaPredkladatele
n19:predkladatel
n3:idSjednocenehoVysledku
331806
n3:idVysledku
RIV/00216224:14310/09:00028505
n3:jazykVysledku
n16:eng
n3:klicovaSlova
iron; iron oxide; thin films; ellipsometry; spectrophotometry; X-ray reflection
n3:klicoveSlovo
n9:ellipsometry n9:iron%20oxide n9:spectrophotometry n9:thin%20films n9:iron n9:X-ray%20reflection
n3:kodStatuVydavatele
JP - Japonsko
n3:kontrolniKodProRIV
[3506866ADA50]
n3:nazevZdroje
e-Journal of Surface Science and Nanotechnology
n3:obor
n8:BM
n3:pocetDomacichTvurcuVysledku
7
n3:pocetTvurcuVysledku
7
n3:projekt
n5:KAN311610701
n3:rokUplatneniVysledku
n10:2009
n3:svazekPeriodika
7
n3:tvurceVysledku
Zajíčková, Lenka Sťahel, Pavel Meduňa, Mojmír Mikulík, Petr Valtr, Miroslav Nečas, David Franta, Daniel
n3:zamer
n17:MSM0021622411 n17:MSM0021622410
s:issn
1348-0391
s:numberOfPages
5
n15:organizacniJednotka
14310