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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F08%3A00026031%21RIV10-MSM-14310___
rdf:type
skos:Concept n16:Vysledek
dcterms:description
A full field X-ray microdiffraction technique is developed providing simultaneously both micrometer-resolved information of crystalline perfection as well as statistical information about the macroscopically illuminated sample. The method allows a detailed characterization of patterned substrates grown by epitaxial lateral overgrowth. Local wing tilts and their fluctuation over the sample area as well as the local and average number of grains in the wings are determined, and the reduction of threading dislocation densities in the grains of the ELO wings can be quantitatively estimated. A full field X-ray microdiffraction technique is developed providing simultaneously both micrometer-resolved information of crystalline perfection as well as statistical information about the macroscopically illuminated sample. The method allows a detailed characterization of patterned substrates grown by epitaxial lateral overgrowth. Local wing tilts and their fluctuation over the sample area as well as the local and average number of grains in the wings are determined, and the reduction of threading dislocation densities in the grains of the ELO wings can be quantitatively estimated.
dcterms:title
Microdiffraction imaging of dislocation densities in microstructured samples Microdiffraction imaging of dislocation densities in microstructured samples
skos:prefLabel
Microdiffraction imaging of dislocation densities in microstructured samples Microdiffraction imaging of dislocation densities in microstructured samples
skos:notation
RIV/00216224:14310/08:00026031!RIV10-MSM-14310___
n3:aktivita
n15:Z
n3:aktivity
Z(MSM0021620834), Z(MSM0021622410)
n3:cisloPeriodika
5
n3:dodaniDat
n12:2010
n3:domaciTvurceVysledku
n4:9021329 n4:2966174
n3:druhVysledku
n18:J
n3:duvernostUdaju
n13:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
379278
n3:idVysledku
RIV/00216224:14310/08:00026031
n3:jazykVysledku
n5:eng
n3:klicovaSlova
X-ray diffraction; X-ray topography; Microdiffraction; Rocking curve imaging; Dislocations; GaN
n3:klicoveSlovo
n6:Microdiffraction n6:Dislocations n6:GaN n6:Rocking%20curve%20imaging n6:X-ray%20topography n6:X-ray%20diffraction
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[4C3C23DA3051]
n3:nazevZdroje
Europhysics Letters
n3:obor
n8:BM
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
11
n3:rokUplatneniVysledku
n12:2008
n3:svazekPeriodika
82
n3:tvurceVysledku
Helfen, L. Mikulík, Petr Pernot, P. Keller, S. Ellyan, M. Baumbach, T. Holý, Václav Lübbert, D. Katona, T. M. DenBaars, S. P. Speck, J.
n3:wos
000256301100016
n3:zamer
n14:MSM0021620834 n14:MSM0021622410
s:issn
0295-5075
s:numberOfPages
5
n11:organizacniJednotka
14310