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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F04%3A00010514%21RIV%2F2005%2FMSM%2F143105%2FN
rdf:type
skos:Concept n12:Vysledek
dcterms:description
NDE activities at the Laboratory for Acoustic Diagnosis and Quality Assurance (EADQ) Dresden are outlined. The applied methods comprise acoustic, thermal, optical and X-ray ones. Additionally, scanning probe methods (SPM) and scanning electron microscopy (SEM) are used. Combinations of different methods are especially effective. This is demonstrated for the coupling of an acoustic approach with SEM. For NDE on a micro- and nano-meter scale, preparation of appropriate test flaws and the verification of the NDE results turn out to be a challenge. To meet this challenge, we propose an approach based on focused ion beam technique. NDE activities at the Laboratory for Acoustic Diagnosis and Quality Assurance (EADQ) Dresden are outlined. The applied methods comprise acoustic, thermal, optical and X-ray ones. Additionally, scanning probe methods (SPM) and scanning electron microscopy (SEM) are used. Combinations of different methods are especially effective. This is demonstrated for the coupling of an acoustic approach with SEM. For NDE on a micro- and nano-meter scale, preparation of appropriate test flaws and the verification of the NDE results turn out to be a challenge. To meet this challenge, we propose an approach based on focused ion beam technique. Publikace shrnuje metody používané v laboratoři EADQ. Tyto metody zahrnují akustické, termické, optické a rtg, a mikroskopii, a je podtrženo jejich použití pro mikro a nanostruktury.
dcterms:title
Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance Mikro a nano NDT v laboratoři pro akustickou diagnostiku a kontrolu kvality Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance
skos:prefLabel
Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance Mikro a nano NDT v laboratoři pro akustickou diagnostiku a kontrolu kvality
skos:notation
RIV/00216224:14310/04:00010514!RIV/2005/MSM/143105/N
n5:strany
63-77
n5:aktivita
n15:Z
n5:aktivity
Z(MSM 143100002)
n5:cisloPeriodika
1
n5:dodaniDat
n16:2005
n5:domaciTvurceVysledku
n8:2966174
n5:druhVysledku
n11:J
n5:duvernostUdaju
n18:S
n5:entitaPredkladatele
n14:predkladatel
n5:idSjednocenehoVysledku
573457
n5:idVysledku
RIV/00216224:14310/04:00010514
n5:jazykVysledku
n10:eng
n5:klicovaSlova
NDE; NDT; materials; X-ray; SEM; SEAM; SPM
n5:klicoveSlovo
n9:SEM n9:SEAM n9:materials n9:SPM n9:NDT n9:NDE n9:X-ray
n5:kodStatuVydavatele
US - Spojené státy americké
n5:kontrolniKodProRIV
[C2E9350459F3]
n5:nazevZdroje
Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II
n5:obor
n6:BM
n5:pocetDomacichTvurcuVysledku
1
n5:pocetTvurcuVysledku
8
n5:rokUplatneniVysledku
n16:2004
n5:svazekPeriodika
5392
n5:tvurceVysledku
Herms, M. Mikulík, Petr Melov, V. Bendjus, B. Helfen, L. Köhler, B. Schreiber, J. Baumbach, T.
n5:zamer
n17:MSM%20143100002
s:numberOfPages
15
n13:isbn
0-8194-5309-9
n19:organizacniJednotka
14310