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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F01%3A00005240%21RIV08-MSM-14310___
rdf:type
skos:Concept n19:Vysledek
dcterms:description
In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view. In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view. In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.
dcterms:title
Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
skos:prefLabel
Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
skos:notation
RIV/00216224:14310/01:00005240!RIV08-MSM-14310___
n3:strany
873
n3:aktivita
n13:Z n13:P
n3:aktivity
P(GA203/00/0085), P(LN00A028), Z(MSM 143100002)
n3:cisloPeriodika
4
n3:dodaniDat
n12:2008
n3:domaciTvurceVysledku
n5:9412921 n5:2026384 n5:3218902
n3:druhVysledku
n16:J
n3:duvernostUdaju
n10:S
n3:entitaPredkladatele
n6:predkladatel
n3:idSjednocenehoVysledku
676064
n3:idVysledku
RIV/00216224:14310/01:00005240
n3:jazykVysledku
n18:eng
n3:klicovaSlova
As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants
n3:klicoveSlovo
n4:Combined%20spectrophotometric%20method n4:Amorphous%20materials n4:As-S%20chalcogenide%20films n4:Optical%20constants
n3:kodStatuVydavatele
RO - Rumunsko
n3:kontrolniKodProRIV
[8CB8CE3B44ED]
n3:nazevZdroje
Journal of Optoelectronics and Advanced Materials
n3:obor
n14:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
5
n3:projekt
n8:LN00A028 n8:GA203%2F00%2F0085
n3:rokUplatneniVysledku
n12:2001
n3:svazekPeriodika
3
n3:tvurceVysledku
Ohlídal, Ivan Frumar, Miroslav Jedelský, Jaroslav Franta, Daniel Navrátil, Karel
n3:zamer
n17:MSM%20143100002
s:issn
1454-4164
s:numberOfPages
6
n15:organizacniJednotka
14310