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Statements

Subject Item
n2:RIV%2F00216224%3A14310%2F01%3A00004310%21RIV08-GA0-14310___
rdf:type
n4:Vysledek skos:Concept
dcterms:description
In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected. In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected. In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected.
dcterms:title
Optical Characterization of Chalcogenide Thin Films Optical Characterization of Chalcogenide Thin Films Optical Characterization of Chalcogenide Thin Films
skos:prefLabel
Optical Characterization of Chalcogenide Thin Films Optical Characterization of Chalcogenide Thin Films Optical Characterization of Chalcogenide Thin Films
skos:notation
RIV/00216224:14310/01:00004310!RIV08-GA0-14310___
n3:strany
555
n3:aktivita
n13:P
n3:aktivity
P(GA203/00/0085), P(LN00A028)
n3:cisloPeriodika
1
n3:dodaniDat
n10:2008
n3:domaciTvurceVysledku
n8:2026384 n8:9412921
n3:druhVysledku
n15:J
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
690173
n3:idVysledku
RIV/00216224:14310/01:00004310
n3:jazykVysledku
n14:eng
n3:klicovaSlova
Chalcogenide films; Dispersion model; Ellipsometry; Reflectometry
n3:klicoveSlovo
n11:Ellipsometry n11:Dispersion%20model n11:Reflectometry n11:Chalcogenide%20films
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[ADB122290018]
n3:nazevZdroje
Applied Surface Science
n3:obor
n18:BM
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
4
n3:projekt
n6:GA203%2F00%2F0085 n6:LN00A028
n3:rokUplatneniVysledku
n10:2001
n3:svazekPeriodika
175-176
n3:tvurceVysledku
Ohlídal, Ivan Franta, Daniel Jedelský, Jaroslav Frumar, Miloslav
s:issn
0169-4332
s:numberOfPages
7
n7:organizacniJednotka
14310