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Statements

Subject Item
n2:RIV%2F00216208%3A11320%2F14%3A10285498%21RIV15-MSM-11320___
rdf:type
n18:Vysledek skos:Concept
rdfs:seeAlso
http://dx.doi.org/10.1016/j.nimb.2014.01.012
dcterms:description
Polyimide (PI), polyetheretherketone (PEEK) and polyethylene terephthalate (PET) foils were implanted with 80 keV Mn+ ions at room temperature at fluencies of 1.0 x 1015-1.0 x 1016 cmMINUS SIGN 2. Mn depth profiles determined by RBS were compared to SRIM 2012 and TRIDYN simulations. The processes taking place in implanted polymers under the annealing procedure were followed. The measured projected ranges RP differ slightly from the SRIM and TRIDYN simulation and the depth profiles are significantly broader (up to 2.4 times) than those simulated by SRIM, while TRIDYN simulations were in a reasonable agreement up to the fluence 0.5 x 1016 in PEEK. Oxygen and hydrogen escape from the implanted layer was examined using RBS and ERDA techniques. PET, PEEK and PI polymers exhibit oxygen depletion up to about 40% of its content in virgin polymers. The compositional changes induced by implantation to particular ion fluence are similar for all polymers examined. After annealing no significant changes of Mn depth distribution was observed even the further oxygen and hydrogen desorption from modified layers appeared. The surface morphology of implanted polymers was characterized using AFM. The most significant change in the surface roughness was observed on PEEK. Implanted Mn atoms tend to dissipate in the polymer matrix, but the Mn nanoparticles are too small to be observed on TEM micrographs. The electrical, optical and structural properties of the implanted and sub-sequently annealed polymers were investigated by sheet resistance measurement and UV-Vis spectroscopy. With increasing ion fluence, the sheet resistance decreases and UV-Vis absorbance increases simultaneously with the decline of optical band gap Eg. Polyimide (PI), polyetheretherketone (PEEK) and polyethylene terephthalate (PET) foils were implanted with 80 keV Mn+ ions at room temperature at fluencies of 1.0 x 1015-1.0 x 1016 cmMINUS SIGN 2. Mn depth profiles determined by RBS were compared to SRIM 2012 and TRIDYN simulations. The processes taking place in implanted polymers under the annealing procedure were followed. The measured projected ranges RP differ slightly from the SRIM and TRIDYN simulation and the depth profiles are significantly broader (up to 2.4 times) than those simulated by SRIM, while TRIDYN simulations were in a reasonable agreement up to the fluence 0.5 x 1016 in PEEK. Oxygen and hydrogen escape from the implanted layer was examined using RBS and ERDA techniques. PET, PEEK and PI polymers exhibit oxygen depletion up to about 40% of its content in virgin polymers. The compositional changes induced by implantation to particular ion fluence are similar for all polymers examined. After annealing no significant changes of Mn depth distribution was observed even the further oxygen and hydrogen desorption from modified layers appeared. The surface morphology of implanted polymers was characterized using AFM. The most significant change in the surface roughness was observed on PEEK. Implanted Mn atoms tend to dissipate in the polymer matrix, but the Mn nanoparticles are too small to be observed on TEM micrographs. The electrical, optical and structural properties of the implanted and sub-sequently annealed polymers were investigated by sheet resistance measurement and UV-Vis spectroscopy. With increasing ion fluence, the sheet resistance decreases and UV-Vis absorbance increases simultaneously with the decline of optical band gap Eg.
dcterms:title
Characterization of PEEK, PET and PI implanted with Mn ions and sub-sequently annealed Characterization of PEEK, PET and PI implanted with Mn ions and sub-sequently annealed
skos:prefLabel
Characterization of PEEK, PET and PI implanted with Mn ions and sub-sequently annealed Characterization of PEEK, PET and PI implanted with Mn ions and sub-sequently annealed
skos:notation
RIV/00216208:11320/14:10285498!RIV15-MSM-11320___
n4:aktivita
n19:I n19:S n19:O n19:P
n4:aktivity
I, O, P(GA106/09/0125), P(GBP302/12/G157), P(LM2011019), S
n4:cisloPeriodika
April
n4:dodaniDat
n7:2015
n4:domaciTvurceVysledku
n9:8972354
n4:druhVysledku
n17:J
n4:duvernostUdaju
n5:S
n4:entitaPredkladatele
n20:predkladatel
n4:idSjednocenehoVysledku
6961
n4:idVysledku
RIV/00216208:11320/14:10285498
n4:jazykVysledku
n14:eng
n4:klicovaSlova
AFM; TEM; RBS; Depth profiles; Polymers; Mn ion implantation
n4:klicoveSlovo
n6:Depth%20profiles n6:RBS n6:AFM n6:Mn%20ion%20implantation n6:TEM n6:Polymers
n4:kodStatuVydavatele
NL - Nizozemsko
n4:kontrolniKodProRIV
[D92FF8A89448]
n4:nazevZdroje
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
n4:obor
n16:BG
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
10
n4:projekt
n15:GA106%2F09%2F0125 n15:LM2011019 n15:GBP302%2F12%2FG157
n4:rokUplatneniVysledku
n7:2014
n4:svazekPeriodika
325
n4:tvurceVysledku
Svorcik, V. Pupikova, H. Matoušek, Jindřich Miksova, R. Gombitová, Adriána Mackova, A. Malinsky, P. Slepicka, P. Khaibullin, R. I. Kováčik, Lubomír
n4:wos
000334086200014
s:issn
0168-583X
s:numberOfPages
7
n10:doi
10.1016/j.nimb.2014.01.012
n12:organizacniJednotka
11320