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Statements

Subject Item
n2:RIV%2F00216208%3A11320%2F13%3A10189299%21RIV14-MSM-11320___
rdf:type
n7:Vysledek skos:Concept
rdfs:seeAlso
http://proceedings.spiedigitallibrary.org/
dcterms:description
The influence of different types of surface etching and surface passivation of high resistivity CdZnTe-based semiconductor detector material was studied with aim to find optimal conditions to improve the properties of metal-semiconductor contact. The influence of different types of surface etching and surface passivation of high resistivity CdZnTe-based semiconductor detector material was studied with aim to find optimal conditions to improve the properties of metal-semiconductor contact.
dcterms:title
Characterization of CdTe and (CdZn)Te detectors with different metal contacts Characterization of CdTe and (CdZn)Te detectors with different metal contacts
skos:prefLabel
Characterization of CdTe and (CdZn)Te detectors with different metal contacts Characterization of CdTe and (CdZn)Te detectors with different metal contacts
skos:notation
RIV/00216208:11320/13:10189299!RIV14-MSM-11320___
n7:predkladatel
n9:orjk%3A11320
n3:aktivita
n23:I
n3:aktivity
I
n3:dodaniDat
n6:2014
n3:domaciTvurceVysledku
n4:8206597 n4:3011232 n4:2756145 n4:4623592
n3:druhVysledku
n15:D
n3:duvernostUdaju
n20:S
n3:entitaPredkladatele
n22:predkladatel
n3:idSjednocenehoVysledku
65058
n3:idVysledku
RIV/00216208:11320/13:10189299
n3:jazykVysledku
n13:eng
n3:klicovaSlova
passivation; contacts; I-V curves; semiconductor gamma-radiation detector; CdZnTe
n3:klicoveSlovo
n10:contacts n10:CdZnTe n10:passivation n10:I-V%20curves n10:semiconductor%20gamma-radiation%20detector
n3:kontrolniKodProRIV
[FD734C68C8D6]
n3:mistoKonaniAkce
San Diego, USA
n3:mistoVydani
USA
n3:nazevZdroje
Proceeding of SPIE
n3:obor
n14:BM
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
5
n3:rokUplatneniVysledku
n6:2013
n3:tvurceVysledku
Grill, Roman Pekárek, Jakub James, Ralph B. Belas, Eduard Uxa, Štěpán
n3:typAkce
n17:WRD
n3:wos
000326643800025
n3:zahajeniAkce
2013-08-25+02:00
s:issn
0277-786X
s:numberOfPages
6
n18:doi
10.1117/12.2023233
n11:hasPublisher
SPIE
n21:isbn
978-0-8194-9702-4
n12:organizacniJednotka
11320