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Statements

Subject Item
n2:RIV%2F00216208%3A11320%2F13%3A10188964%21RIV14-MSM-11320___
rdf:type
skos:Concept n10:Vysledek
rdfs:seeAlso
http://www.sciencedirect.com/science/article/pii/S0360319913007362
dcterms:description
The development of the microstructure in nanocrystalline, polycrystalline and epitaxial Pd films loaded with hydrogen is investigated. Structural changes in Pd films loaded with hydrogen were characterized by positron annihilation spectroscopy combined with electron microscopy and X-ray diffraction. It was found that hydrogen charging causes plastic deformation which leads to an increase of the defect density in all Pd films studied. Moreover, the formation of buckles was observed in nanocrystalline and polycrystalline Pd films loaded above a certain critical hydrogen concentration. Buckling leads to detachment of the film from the substrate and this is accompanied with in-plane stress relaxation and plastic deformation of the film. The development of the microstructure in nanocrystalline, polycrystalline and epitaxial Pd films loaded with hydrogen is investigated. Structural changes in Pd films loaded with hydrogen were characterized by positron annihilation spectroscopy combined with electron microscopy and X-ray diffraction. It was found that hydrogen charging causes plastic deformation which leads to an increase of the defect density in all Pd films studied. Moreover, the formation of buckles was observed in nanocrystalline and polycrystalline Pd films loaded above a certain critical hydrogen concentration. Buckling leads to detachment of the film from the substrate and this is accompanied with in-plane stress relaxation and plastic deformation of the film.
dcterms:title
Hydrogen-induced microstructural changes of Pd films Hydrogen-induced microstructural changes of Pd films
skos:prefLabel
Hydrogen-induced microstructural changes of Pd films Hydrogen-induced microstructural changes of Pd films
skos:notation
RIV/00216208:11320/13:10188964!RIV14-MSM-11320___
n10:predkladatel
n11:orjk%3A11320
n5:aktivita
n19:I n19:S n19:P
n5:aktivity
I, P(LH12173), P(MEB101102), S
n5:cisloPeriodika
27
n5:dodaniDat
n6:2014
n5:domaciTvurceVysledku
n12:5586992 n12:9949097 n12:9843558 n12:7037945 n12:9383697 n12:7072589
n5:druhVysledku
n21:J
n5:duvernostUdaju
n7:S
n5:entitaPredkladatele
n18:predkladatel
n5:idSjednocenehoVysledku
78481
n5:idVysledku
RIV/00216208:11320/13:10188964
n5:jazykVysledku
n15:eng
n5:klicovaSlova
X-ray diffraction; Positron annihilation spectroscopy; Hydrogen; Palladium films
n5:klicoveSlovo
n14:Palladium%20films n14:Positron%20annihilation%20spectroscopy n14:X-ray%20diffraction n14:Hydrogen
n5:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n5:kontrolniKodProRIV
[BE08A3F1EBEC]
n5:nazevZdroje
International Journal of Hydrogen Energy
n5:obor
n20:BM
n5:pocetDomacichTvurcuVysledku
6
n5:pocetTvurcuVysledku
12
n5:projekt
n9:MEB101102 n9:LH12173
n5:rokUplatneniVysledku
n6:2013
n5:svazekPeriodika
38
n5:tvurceVysledku
Brauer, G. Lukáč, František Wagner, S. Uchida, H. Pundt, A. Anwand, W. Vlček, Marián Muecklich, A. Vlach, Martin Melikhova, Oksana Procházka, Ivan Čížek, Jakub
n5:wos
000324563200051
s:issn
0360-3199
s:numberOfPages
11
n4:doi
10.1016/j.ijhydene.2013.03.096
n16:organizacniJednotka
11320