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Statements

Subject Item
n2:RIV%2F00216208%3A11320%2F13%3A10159390%21RIV14-GA0-11320___
rdf:type
n10:Vysledek skos:Concept
rdfs:seeAlso
http://dx.doi.org/10.5566/ias.v32.p65-75
dcterms:description
Orientation imaging microscopy (OIM) allows to measure crystallic orientations at the surface of a material. Digitalized data representing the orientations are processed to recognize the grain structure and they are visualized in crystal orientation maps. Analysis of the data firstly consists in recognition of grain boundaries followed by identification of grains themselves. Knowing the grain morphology, it is possible to characterize the grain size homogeneity and estimate structural parameters related to the physical properties of the material. The paper describes methods of imaging and quantitative characterization of the grain boundary structure in metals based on data from electron backscatter diffraction (EBSD). These methods are applied to samples of copper processed by equal-channel angular pressing (ECAP). Orientation imaging microscopy (OIM) allows to measure crystallic orientations at the surface of a material. Digitalized data representing the orientations are processed to recognize the grain structure and they are visualized in crystal orientation maps. Analysis of the data firstly consists in recognition of grain boundaries followed by identification of grains themselves. Knowing the grain morphology, it is possible to characterize the grain size homogeneity and estimate structural parameters related to the physical properties of the material. The paper describes methods of imaging and quantitative characterization of the grain boundary structure in metals based on data from electron backscatter diffraction (EBSD). These methods are applied to samples of copper processed by equal-channel angular pressing (ECAP).
dcterms:title
QUANTITATIVE CHARACTERIZATION OF MICROSTRUCTURE OF PURE COPPER PROCESSED BY ECAP QUANTITATIVE CHARACTERIZATION OF MICROSTRUCTURE OF PURE COPPER PROCESSED BY ECAP
skos:prefLabel
QUANTITATIVE CHARACTERIZATION OF MICROSTRUCTURE OF PURE COPPER PROCESSED BY ECAP QUANTITATIVE CHARACTERIZATION OF MICROSTRUCTURE OF PURE COPPER PROCESSED BY ECAP
skos:notation
RIV/00216208:11320/13:10159390!RIV14-GA0-11320___
n10:predkladatel
n19:orjk%3A11320
n3:aktivita
n8:I n8:P
n3:aktivity
I, P(ED2.1.00/03.0111), P(GAP201/10/0472)
n3:cisloPeriodika
2
n3:dodaniDat
n16:2014
n3:domaciTvurceVysledku
n5:5208327 n5:4355598
n3:druhVysledku
n14:J
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n7:predkladatel
n3:idSjednocenehoVysledku
101203
n3:idVysledku
RIV/00216208:11320/13:10159390
n3:jazykVysledku
n4:eng
n3:klicovaSlova
second-order analysis; random marked sets; equal-channel angular pressing; electron backscatter diffraction
n3:klicoveSlovo
n6:second-order%20analysis n6:equal-channel%20angular%20pressing n6:electron%20backscatter%20diffraction n6:random%20marked%20sets
n3:kodStatuVydavatele
SI - Slovinská republika
n3:kontrolniKodProRIV
[72D1573CED73]
n3:nazevZdroje
Image Analysis and Stereology
n3:obor
n9:JG
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
5
n3:projekt
n17:ED2.1.00%2F03.0111 n17:GAP201%2F10%2F0472
n3:rokUplatneniVysledku
n16:2013
n3:svazekPeriodika
32
n3:tvurceVysledku
Šedivý, Ondřej Beneš, Viktor Ponizil, Petr Sklenicka, Václav Kral, Petr
n3:wos
000322293200001
s:issn
1580-3139
s:numberOfPages
11
n18:doi
10.5566/ias.v32.p65-75
n20:organizacniJednotka
11320