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Statements

Subject Item
n2:RIV%2F00216208%3A11320%2F09%3A00207296%21RIV10-MSM-11320___
rdf:type
n11:Vysledek skos:Concept
dcterms:description
Internal structure of semiconductor nanowires was studied by x-ray grazing-incidence x-ray diffraction and x-ray small-angle scattering Internal structure of semiconductor nanowires was studied by x-ray grazing-incidence x-ray diffraction and x-ray small-angle scattering
dcterms:title
Structural Investigations of Core-Shell Nanowires Using Grazing Incidence X-Ray Diffraction Structural Investigations of Core-Shell Nanowires Using Grazing Incidence X-Ray Diffraction
skos:prefLabel
Structural Investigations of Core-Shell Nanowires Using Grazing Incidence X-Ray Diffraction Structural Investigations of Core-Shell Nanowires Using Grazing Incidence X-Ray Diffraction
skos:notation
RIV/00216208:11320/09:00207296!RIV10-MSM-11320___
n3:aktivita
n7:Z
n3:aktivity
Z(MSM0021620834)
n3:cisloPeriodika
5
n3:dodaniDat
n5:2010
n3:domaciTvurceVysledku
n16:9021329
n3:druhVysledku
n13:J
n3:duvernostUdaju
n10:S
n3:entitaPredkladatele
n9:predkladatel
n3:idSjednocenehoVysledku
344151
n3:idVysledku
RIV/00216208:11320/09:00207296
n3:jazykVysledku
n15:eng
n3:klicovaSlova
Structural; Investigations; Core-Shell; Nanowires; Using; Grazing; Incidence; X-Ray; Diffraction
n3:klicoveSlovo
n8:X-Ray n8:Investigations n8:Structural n8:Core-Shell n8:Using n8:Diffraction n8:Grazing n8:Incidence n8:Nanowires
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[1B5A203DC48A]
n3:nazevZdroje
Nano Letters
n3:obor
n12:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
10
n3:rokUplatneniVysledku
n5:2009
n3:svazekPeriodika
9
n3:tvurceVysledku
Holý, Václav Bauer, G. Kriegner, D. Mandl, B. Martensson, T. Samuelson, L. Keplinger, M. Stangl, J. Wintersberger, E. Deppert, K.
n3:wos
000266157100027
n3:zamer
n17:MSM0021620834
s:issn
1530-6984
s:numberOfPages
6
n18:organizacniJednotka
11320