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Statements

Subject Item
n2:RIV%2F00216208%3A11320%2F09%3A00206584%21RIV10-MSM-11320___
rdf:type
n12:Vysledek skos:Concept
dcterms:description
Cerium oxide layers grown on Cu(111) were studied by conventional X-ray and resonant photoelectron spectroscopy with synchrotron radiation. A quantitative method of determining the cerium chemical state from the Ce 3d photoelectron spectra is described in detail. After the preparation of the ceria layer, Sn films of different thickness were evaporated onto the surface at temperatures of 120, 300 and 520 K. In all three cases, the deposited Sn was oxidized, CeO2 was partially reduced, and a mixed Sn-Ce-O oxide was formed. The quantitative extent of these reactions was found to be determined by limited diffusion of the deposited Sn atoms into the ceria layer at low temperature. The excess of tin formed a metallic overlayer on the sample surface. Cerium oxide layers grown on Cu(111) were studied by conventional X-ray and resonant photoelectron spectroscopy with synchrotron radiation. A quantitative method of determining the cerium chemical state from the Ce 3d photoelectron spectra is described in detail. After the preparation of the ceria layer, Sn films of different thickness were evaporated onto the surface at temperatures of 120, 300 and 520 K. In all three cases, the deposited Sn was oxidized, CeO2 was partially reduced, and a mixed Sn-Ce-O oxide was formed. The quantitative extent of these reactions was found to be determined by limited diffusion of the deposited Sn atoms into the ceria layer at low temperature. The excess of tin formed a metallic overlayer on the sample surface.
dcterms:title
Cerium oxide stoichiometry alteration via Sn deposition: Influence of temperature Cerium oxide stoichiometry alteration via Sn deposition: Influence of temperature
skos:prefLabel
Cerium oxide stoichiometry alteration via Sn deposition: Influence of temperature Cerium oxide stoichiometry alteration via Sn deposition: Influence of temperature
skos:notation
RIV/00216208:11320/09:00206584!RIV10-MSM-11320___
n4:aktivita
n8:Z n8:P
n4:aktivity
P(LC06058), Z(MSM0021620834)
n4:cisloPeriodika
1
n4:dodaniDat
n10:2010
n4:domaciTvurceVysledku
n13:3117138 n13:8636303
n4:druhVysledku
n15:J
n4:duvernostUdaju
n18:S
n4:entitaPredkladatele
n16:predkladatel
n4:idSjednocenehoVysledku
306331
n4:idVysledku
RIV/00216208:11320/09:00206584
n4:jazykVysledku
n11:eng
n4:klicovaSlova
Cerium; oxide; stoichiometry; alteration; deposition; Influence; temperature
n4:klicoveSlovo
n5:Influence n5:alteration n5:deposition n5:oxide n5:stoichiometry n5:Cerium n5:temperature
n4:kodStatuVydavatele
NL - Nizozemsko
n4:kontrolniKodProRIV
[C3F911DFE795]
n4:nazevZdroje
Journal of Electron Spectroscopy and Related Phenomena
n4:obor
n19:BM
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
4
n4:projekt
n17:LC06058
n4:rokUplatneniVysledku
n10:2009
n4:svazekPeriodika
169
n4:tvurceVysledku
Skála, T. Prince, K. C. Matolín, Vladimír Šutara, František
n4:wos
000263571900003
n4:zamer
n14:MSM0021620834
s:issn
0368-2048
s:numberOfPages
6
n6:organizacniJednotka
11320