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Statements

Subject Item
n2:RIV%2F00216208%3A11320%2F03%3A00002402%21RIV%2F2004%2FGA0%2F113204%2FN
rdf:type
n5:Vysledek skos:Concept
dcterms:description
Structural investigation of semiconductor nanostructures by X-ray techniques Structural investigation of semiconductor nanostructures by X-ray techniques
dcterms:title
Structural investigation of semiconductor nanostructures by X-ray techniques Structural investigation of semiconductor nanostructures by X-ray techniques
skos:prefLabel
Structural investigation of semiconductor nanostructures by X-ray techniques Structural investigation of semiconductor nanostructures by X-ray techniques
skos:notation
RIV/00216208:11320/03:00002402!RIV/2004/GA0/113204/N
n3:strany
11;23
n3:aktivita
n17:P
n3:aktivity
P(GA202/03/0148)
n3:cisloPeriodika
1
n3:dodaniDat
n8:2004
n3:domaciTvurceVysledku
n11:9021329
n3:druhVysledku
n16:J
n3:duvernostUdaju
n14:S
n3:entitaPredkladatele
n12:predkladatel
n3:idSjednocenehoVysledku
629205
n3:idVysledku
RIV/00216208:11320/03:00002402
n3:jazykVysledku
n6:eng
n3:klicovaSlova
Structural;investigation;semiconductor;nanostructures;X-ray;techniques
n3:klicoveSlovo
n7:techniques n7:investigation n7:semiconductor n7:nanostructures n7:X-ray n7:Structural
n3:kodStatuVydavatele
NL - Nizozemsko
n3:kontrolniKodProRIV
[709DB244A9C2]
n3:nazevZdroje
Nuclear Instruments and Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms
n3:obor
n10:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
7
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n9:GA202%2F03%2F0148
n3:rokUplatneniVysledku
n8:2003
n3:svazekPeriodika
200
n3:tvurceVysledku
Holý, Václav
s:issn
0168-583X
s:numberOfPages
13
n18:organizacniJednotka
11320