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Statements

Subject Item
n2:RIV%2F00216208%3A11310%2F11%3A10105639%21RIV12-GA0-11310___
rdf:type
n12:Vysledek skos:Concept
dcterms:description
The paper reports computations for all lanthanoids L on their encapsulation into the only C74 IPR (isolated pentagon rule) cage (L@C74), for Z@C82 based on encapsulation into the IPR C2v C82 cage, and also for the mixed (metal-sulfur) Z2S@C82 endohedrals. Their structural and energetic characteristics are used for evaluations of the relative production yields, employing the encapsulation Gibbs-energy terms and saturated metal pressures. It is moreover shown that the encapsulation potential-energy changes in such series can be well related to the mere ionization potentials of the free metal atoms. The paper reports computations for all lanthanoids L on their encapsulation into the only C74 IPR (isolated pentagon rule) cage (L@C74), for Z@C82 based on encapsulation into the IPR C2v C82 cage, and also for the mixed (metal-sulfur) Z2S@C82 endohedrals. Their structural and energetic characteristics are used for evaluations of the relative production yields, employing the encapsulation Gibbs-energy terms and saturated metal pressures. It is moreover shown that the encapsulation potential-energy changes in such series can be well related to the mere ionization potentials of the free metal atoms.
dcterms:title
Calculated Production Yields in Metallofullerene Series. In: NANOTECH 2011 - Technical Proceedings of the 2011 Calculated Production Yields in Metallofullerene Series. In: NANOTECH 2011 - Technical Proceedings of the 2011
skos:prefLabel
Calculated Production Yields in Metallofullerene Series. In: NANOTECH 2011 - Technical Proceedings of the 2011 Calculated Production Yields in Metallofullerene Series. In: NANOTECH 2011 - Technical Proceedings of the 2011
skos:notation
RIV/00216208:11310/11:10105639!RIV12-GA0-11310___
n12:predkladatel
n22:orjk%3A11310
n3:aktivita
n19:Z n19:P
n3:aktivity
P(GAP208/10/0179), Z(MSM0021620857)
n3:dodaniDat
n5:2012
n3:domaciTvurceVysledku
n9:3305406
n3:druhVysledku
n4:D
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n7:predkladatel
n3:idSjednocenehoVysledku
189006
n3:idVysledku
RIV/00216208:11310/11:10105639
n3:jazykVysledku
n23:eng
n3:klicovaSlova
metallofullerene stability islands; ionization potentials; molecular electronic structure; molecular modeling; molecular electronics; carbon-based nanotechnology; endohedral fullerenes
n3:klicoveSlovo
n13:molecular%20electronics n13:metallofullerene%20stability%20islands n13:molecular%20electronic%20structure n13:molecular%20modeling n13:carbon-based%20nanotechnology n13:ionization%20potentials n13:endohedral%20fullerenes
n3:kontrolniKodProRIV
[1B28EF4C3598]
n3:mistoKonaniAkce
Boston
n3:mistoVydani
Cambridge
n3:nazevZdroje
Nanotech 2011: Technical Proceedings of the 2011 NSTI Nanotechnology Conference and Expo (Volumes 1-3)
n3:obor
n6:CF
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
4
n3:projekt
n18:GAP208%2F10%2F0179
n3:rokUplatneniVysledku
n5:2011
n3:tvurceVysledku
Akasaka, T. Nagase, S. Slanina, Zdeněk Uhlík, Filip
n3:typAkce
n20:WRD
n3:zahajeniAkce
2011-06-13+02:00
n3:zamer
n17:MSM0021620857
s:numberOfPages
4
n21:hasPublisher
CRC Press
n14:isbn
978-1-4398-7139-3
n15:organizacniJednotka
11310