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Namespace Prefixes

PrefixIRI
n20http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n15http://purl.org/net/nknouf/ns/bibtex#
n11http://localhost/temp/predkladatel/
n17http://linked.opendata.cz/resource/domain/vavai/projekt/
n6http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n14http://linked.opendata.cz/ontology/domain/vavai/
n7https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n9http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n5http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00000493%3AG39__%2F10%3A%230000149%21RIV11-MO0-G39_____/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n13http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n8http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n19http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n12http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n16http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00000493%3AG39__%2F10%3A%230000149%21RIV11-MO0-G39_____
rdf:type
skos:Concept n14:Vysledek
dcterms:description
The aim of this study is to evaluate the influence of HPM and UWB parameters on effects on electronics. All basic parameters like frequency, pulse width and repetition rate will be taken in to account. Results from transfer function measurements as well as results from electromagnetic susceptibility measurements will be presented and evaluated. Both typical failures (temporary as well as permanent damage) of electronics will be considered. The results related to permanent damage of electronics will be compared with results from simulations with use of model based on electro-thermal analogy (PSpice model). At the end of this presentation recommendation for parameters of HPM and UWB for effective influence on electronics were carried out. The aim of this study is to evaluate the influence of HPM and UWB parameters on effects on electronics. All basic parameters like frequency, pulse width and repetition rate will be taken in to account. Results from transfer function measurements as well as results from electromagnetic susceptibility measurements will be presented and evaluated. Both typical failures (temporary as well as permanent damage) of electronics will be considered. The results related to permanent damage of electronics will be compared with results from simulations with use of model based on electro-thermal analogy (PSpice model). At the end of this presentation recommendation for parameters of HPM and UWB for effective influence on electronics were carried out.
dcterms:title
HPEM Environment – Crucial Parameters HPEM Environment – Crucial Parameters
skos:prefLabel
HPEM Environment – Crucial Parameters HPEM Environment – Crucial Parameters
skos:notation
RIV/00000493:G39__/10:#0000149!RIV11-MO0-G39_____
n3:aktivita
n13:P
n3:aktivity
P(OSVTUPV200902)
n3:dodaniDat
n16:2011
n3:domaciTvurceVysledku
n6:7234864 n6:3657027
n3:druhVysledku
n12:D
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n5:predkladatel
n3:idSjednocenehoVysledku
262213
n3:idVysledku
RIV/00000493:G39__/10:#0000149
n3:jazykVysledku
n8:eng
n3:klicovaSlova
HPEM; DEW; HPM; UWB; Electromagnetic threat
n3:klicoveSlovo
n9:HPM n9:UWB n9:Electromagnetic%20threat n9:HPEM n9:DEW
n3:kontrolniKodProRIV
[BFDF7B7E0109]
n3:mistoKonaniAkce
Ottawa, Kanada
n3:mistoVydani
Ottawa, Kanada
n3:nazevZdroje
2010 14th International Symposium on Antenna Technology and Applied Electromagnetics
n3:obor
n19:JS
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n17:OSVTUPV200902
n3:rokUplatneniVysledku
n16:2010
n3:tvurceVysledku
Suchý, Luboš Palíšek, Libor
n3:typAkce
n20:WRD
n3:zahajeniAkce
2010-07-05+02:00
s:numberOfPages
1
n15:hasPublisher
IEEE Catalog Number: CFP1056F-CDR
n7:isbn
978-1-4244-5050-3
n11:organizacniJednotka
G39