This HTML5 document contains 26 embedded RDF statements represented using HTML+Microdata notation.

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Namespace Prefixes

PrefixIRI
n12http://linked.opendata.cz/resource/domain/vavai/cep/kategorie/
n5http://linked.opendata.cz/resource/domain/vavai/cep/soutez/
dctermshttp://purl.org/dc/terms/
n2http://linked.opendata.cz/resource/domain/vavai/cep/projekt/MSM/
n10http://linked.opendata.cz/resource/domain/vavai/cep/aktivita/
n3http://linked.opendata.cz/ontology/domain/vavai/
n4http://linked.opendata.cz/resource/domain/vavai/cep/obor/
n8http://linked.opendata.cz/resource/domain/vavai/cep/druh-souteze/
n9http://linked.opendata.cz/resource/domain/vavai/cep/smlouva/1729/
n11http://linked.opendata.cz/resource/domain/vavai/cep/faze/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n6http://linked.opendata.cz/resource/domain/vavai/cep/typ/
n13http://linked.opendata.cz/resource/domain/vavai/cep/poskytovatel/
xsdhhttp://www.w3.org/2001/XMLSchema#

Statements

Subject Item
n2:OE08012
rdf:type
n3:Projekt
dcterms:description
Vyvinout počítačové modely interakce elektronů s materiálem a souhrnného procesu detekce rastrovaného obrazu, vytvořit nové techniky vytváření kontrastu a nové typy detektorů a použít je při zobrazování nových polovodičových materiálů a nanostruktur. The project aims to increase our knowledge of the complex physical interaction mechanisms between electrons in various semiconductor materials. This should lead to: - an understanding of contrast mechanisms in Scanning Electron Microscopy - the evaluation of new contrast mechanisms, - methods, techniques and electron detection devices able to generate and exploit contrast in SEM-nanographs to the full, both qualitatively and quantitatively. The final result of the project is that the capabilities of this technique, which is already applied in the study of semiconductor devices, can be significantly enhanced, fulfilling a strong existing need in the semiconductor industry.
dcterms:title
Kontrast a detekce v rastrovací elektronové mikroskopii (Contrast and detection in scanning electron microscopy) Contrast and detection in scanning electron microscopy
n3:cislo-smlouvy
n9:2010-32
n3:dalsi-vedlejsi-obor
n4:JB
n3:druh-souteze
n8:VS
n3:faze
n11:53243451
n3:hlavni-obor
n4:JA
n3:vedlejsi-obor
n4:BM
n3:id-aktivity
n10:OE
n3:id-souteze
n5:SMSM2008OE3
n3:kategorie
n12:2
n3:klicova-slova
scanning electron microscopy; image contrast; detection of electrons; semiconductors; nanotechnology
n3:konec-reseni
2010-12-31+01:00
n3:pocet-koordinujicich-prijemcu
0
n3:poskytovatel
n13:MSM
n3:start-reseni
2008-01-01+01:00
n3:statni-podpora
7322
n3:typProjektu
n6:P
n3:uznane-naklady
18270
n3:pocet-prijemcu
1
n3:pocet-spoluprijemcu
1
n3:pocet-vysledku
13
n3:pocet-vysledku-zverejnovanych
13