About: Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Measurements are shown of GeV pions and muons in two 300μm thick, Si Medipix pixel detector assemblies that are stacked on top of each other, with a 25μm thick brass foil in between. In such a radiation imaging semiconductor matrix with a large number of pixels along the particle trail, one can determine local space vectors for the particle trajectory instead of points. This improves pattern recognition and track reconstruction, especially in a crowded environment. Stacking of sensor planes is essential for resolving directional ambiguities. Signal charge sharing can be employed for measuring positions with submicron precision. In the measurements one notices accompanying 'delta' electrons that emerge outside the particle trail, far beyond the boundaries of the 55μm pixel cells. The frequency of such corrupted position measurements is ~ one per 2.5mm of traversed Si. Measurements are shown of GeV pions and muons in two 300μm thick, Si Medipix pixel detector assemblies that are stacked on top of each other, with a 25μm thick brass foil in between. In such a radiation imaging semiconductor matrix with a large number of pixels along the particle trail, one can determine local space vectors for the particle trajectory instead of points. This improves pattern recognition and track reconstruction, especially in a crowded environment. Stacking of sensor planes is essential for resolving directional ambiguities. Signal charge sharing can be employed for measuring positions with submicron precision. In the measurements one notices accompanying 'delta' electrons that emerge outside the particle trail, far beyond the boundaries of the 55μm pixel cells. The frequency of such corrupted position measurements is ~ one per 2.5mm of traversed Si. (en)
Title	Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors (en)
skos:prefLabel	Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors (en)
skos:notation	RIV/68407700:21670/10:00175161!RIV11-MSM-21670___
http://linked.open...avai/riv/aktivita	P R Z
http://linked.open...avai/riv/aktivity	P(7E08050), P(LC06041), R, Z(MSM6840770029), Z(MSM6840770040)
http://linked.open...iv/cisloPeriodika	C06004
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Jakůbek, Jan Vykydal, Zdeněk Tureček, Daniel Pospíšil, Stanislav Heijne, Henricus Maria
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Ústav technické a experimentální fyziky ČVUT
http://linked.open...dnocenehoVysledku	295384
http://linked.open...ai/riv/idVysledku	RIV/68407700:21670/10:00175161
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	dE/dx detectors; Particle tracking detectors; Pattern recognition, cluster finding, calibration and fitting methods; Detector design and construction technologies and materials (en)
http://linked.open.../riv/klicoveSlovo	dE/dx detectors Pattern recognition Particle tracking detectors Detector design and construction technologies and materials calibration and fitting methods cluster finding
http://linked.open...odStatuVydavatele	IT - Italská republika
http://linked.open...ontrolniKodProRIV	[1F3C88D9DBB8]
http://linked.open...i/riv/nazevZdroje	Journal of Instrumentation
http://linked.open...in/vavai/riv/obor	BG
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	17 (xsd:int)
http://linked.open...vavai/riv/projekt	Preparatory Phase of the Large Hadron Collider Upgrade Preparation, modification and characterization of materials by energetic radiation.
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	6
http://linked.open...iv/tvurceVysledku	Ballabriga, R. Campbell, M. Heijne, Henricus Maria Jakůbek, Jan Leroy, C. Plackett, R. Pospíšil, Stanislav Tlustos, L. Tureček, Daniel Visser, J. Vykydal, Zdeněk Wong, W. Idarraga, J. Vermeulen, J. Boltje, D. Llopard, X. Visschers, J.
http://linked.open...ain/vavai/riv/wos	000280526600008
http://linked.open...n/vavai/riv/zamer	Application of radionuclides and ionising radiation Fundamental Experiments in Physics of Microworld
issn	1748-0221
number of pages	6 (xsd:int)
http://localhost/t...ganizacniJednotka	21670
is http://linked.open...avai/riv/vysledek of	Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors Vectors and submicron precision: redundancy and 3D stacking in silicon pixel detectors

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