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Description
  • New developments in nanoscience and nanotechnology require nanometer scale resolution imaging tools and techniques such as an extreme ultraviolet (EUV) and soft X-ray (SXR) microscopy, based on Fresnel zone plates. In this paper, we report on applications of a desk-top microscopy using a laser-plasma EUV source based on a gas-puff target for studies of morphology of thin silicon membranes coated with NaCl crystals and samples composed of ZnO nanofibers.
  • New developments in nanoscience and nanotechnology require nanometer scale resolution imaging tools and techniques such as an extreme ultraviolet (EUV) and soft X-ray (SXR) microscopy, based on Fresnel zone plates. In this paper, we report on applications of a desk-top microscopy using a laser-plasma EUV source based on a gas-puff target for studies of morphology of thin silicon membranes coated with NaCl crystals and samples composed of ZnO nanofibers. (en)
Title
  • Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy
  • Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy (en)
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  • Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy
  • Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy (en)
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  • RIV/68407700:21460/13:00205809!RIV14-MSM-21460___
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  • P(EE.2.3.20.0092), P(KAN300100702), S
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  • 0
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  • 108664
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  • RIV/68407700:21460/13:00205809
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  • Nanoimaging; Extreme ultraviolet; EUV Microscopy; Fresnel zoneplates; Thin membranes; ZnO nanofibers (en)
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  • US - Spojené státy americké
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  • [9BCF2C119F33]
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  • Radiation Physics and Chemistry
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  • 93
http://linked.open...iv/tvurceVysledku
  • Brůža, Petr
  • Pánek, Dalibor
  • Bartnik, A.
  • Fiedorowicz, H.
  • Wachulak, P. W.
  • Jarocki, R.
  • Kostecki, J.
  • Szczurek, M.
  • Baranowska-Korczyc, A.
  • Elbaum, D.
  • Fronc, K.
  • Węgrzyński, Ł.
http://linked.open...ain/vavai/riv/wos
  • 000326910900011
issn
  • 0969-806X
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.radphyschem.2013.02.019
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  • 21460
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