About: Comparison of micro and macro scratch testing methods for adhesion and microhardness determination of thin films

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About: Comparison of micro and macro scratch testing methods for adhesion and microhardness determination of thin films Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this work, we focused on the usability of scratch test technique for determination of thin films adhesion with the layer thicknesses around one hundred nanometres and less. For this study we prepared titanium dioxide and diamond-like-carbon thin films deposited by Pulsed Laser Deposition technique. We tested microhardness and friction behaviour on the same samples. We tested adhesion properties by micro and macro scratch tests techniques on three different measurement instruments. We used macroscratch tester Revetest (CSM corp.), nanosclerometric extending atomic force microscope (AFM) head Solver Next (NT-MTD corp.), and Hysitron TI950 with nanoscratch transducer. We observed and compared abilities for the each individual instrument to evaluate adhesion of thin films with thickness of several tenths of nanometres. We were looking for advantages and disadvantages of these systems and methods. In this work, we focused on the usability of scratch test technique for determination of thin films adhesion with the layer thicknesses around one hundred nanometres and less. For this study we prepared titanium dioxide and diamond-like-carbon thin films deposited by Pulsed Laser Deposition technique. We tested microhardness and friction behaviour on the same samples. We tested adhesion properties by micro and macro scratch tests techniques on three different measurement instruments. We used macroscratch tester Revetest (CSM corp.), nanosclerometric extending atomic force microscope (AFM) head Solver Next (NT-MTD corp.), and Hysitron TI950 with nanoscratch transducer. We observed and compared abilities for the each individual instrument to evaluate adhesion of thin films with thickness of several tenths of nanometres. We were looking for advantages and disadvantages of these systems and methods. (en)
Title	Comparison of micro and macro scratch testing methods for adhesion and microhardness determination of thin films Comparison of micro and macro scratch testing methods for adhesion and microhardness determination of thin films (en)
skos:prefLabel	Comparison of micro and macro scratch testing methods for adhesion and microhardness determination of thin films Comparison of micro and macro scratch testing methods for adhesion and microhardness determination of thin films (en)
skos:notation	RIV/68407700:21460/11:00185457!RIV15-MSM-21460___
http://linked.open...avai/riv/aktivita	S
http://linked.open...avai/riv/aktivity	S
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Kocourek, Tomáš Kutílek, Patrik Mikšovský, Jan Remsa, Jan Jelínek, Miroslav
http://linked.open.../riv/druhVysledku	O - Ostatní výsledky nezařaditelné do žádného z výše uvedených druhů výsledku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta biomedicínského inženýrství
http://linked.open...dnocenehoVysledku	191182
http://linked.open...ai/riv/idVysledku	RIV/68407700:21460/11:00185457
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	thin films; adhesion; scratch test; nanoindentation; standards; standardization; diamond-like-carbon (DLC); titanium dioxide (TiO2) (en)
http://linked.open.../riv/klicoveSlovo	nanoindentation adhesion scratch test standardization standards thin films titanium dioxide (TiO2) diamond-like-carbon (DLC)
http://linked.open...ontrolniKodProRIV	[48AD9A9C95C7]
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...UplatneniVysledku	2011
http://linked.open...iv/tvurceVysledku	Jelínek, Miroslav Kocourek, Tomáš Kutílek, Patrik Lukeš, Jaroslav Mikšovský, Jan Remsa, Jan Tolde, Zdeněk
http://localhost/t...ganizacniJednotka	21460

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